SLAAED9 November   2023 TAA5412-Q1 , TAC5311-Q1 , TAC5312-Q1 , TAC5411-Q1 , TAC5412-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Diagnostic Monitoring Architecture
  6. Monitored Faults
    1. 3.1 Microphone Faults
      1. 3.1.1 Inputs Shorted to Ground
      2. 3.1.2 Inputs Shorted to MICBIAS
      3. 3.1.3 Input Open Circuit
      4. 3.1.4 Input Pins Shorted Together
      5. 3.1.5 Input Overvoltage Detection
      6. 3.1.6 Inputs Shorted to VBAT
    2. 3.2 Line Out Faults
      1. 3.2.1 Output Overcurrent
      2. 3.2.2 Virtual Ground
    3. 3.3 Other Faults
      1. 3.3.1 MICBIAS Overvoltage
        1. 3.3.1.1 DIAG_CFG11 Register (page = 0x01, address = 0x51) [Reset = 0x40]
      2. 3.3.2 MICBIAS Overcurrent
      3. 3.3.3 MICBIAS Load Current
        1. 3.3.3.1 DIAG_CFG6 Register (page = 0x01, address = 0x4C) [Reset = 0xA2]
        2. 3.3.3.2 DIAG_CFG7 Register
      4. 3.3.4 Overtemperature Fault
      5. 3.3.5 Supply Back Pumping
  7. Enabling Diagnostics and Programming Thresholds
    1. 4.1 DIAG_CFG0 Register (page = 0x01, Address = 0x46) [Reset = 0x00]
    2. 4.2 DIAG_CFG1 Register (page = 0x01, Address = 0x47) [Reset = 0x37]
    3. 4.3 DIAG_CFG2 Register (page = 0x01, Address = 0x48) [Reset = 0x87]
  8. Fault Diagnostic Setup Procedure
  9. Fault Reporting
    1. 6.1 Live Registers
      1. 6.1.1 CHx_LIVE Register (page = 0x01, address = 0x3D) [Reset = 0b]
      2. 6.1.2 CH1_LIVE Register (page = 0x01, address = 0x3E) [Reset = 0h]
      3. 6.1.3 INT_LIVE0 Register (page = 0x01, address = 0x3C) [Reset = 00]
      4. 6.1.4 INT_LIVE1 Register (page = 0x00, address = 0x42) [reset = 0x00]
      5. 6.1.5 INT_LIVE2 Register (page = 0x00, address = 0x43) [reset = 0x00]
    2. 6.2 Latched Registers
      1. 6.2.1 Clearing Latched Registers
    3. 6.3 Fault Filtering and Response Time
      1. 6.3.1 Debounce
      2. 6.3.2 Scan Rate
        1. 6.3.2.1 DIAG_CFG4 Register (page = 0x01, address = 0x4A) [reset = 0xB8]
      3. 6.3.3 Moving Average
        1. 6.3.3.1 DIAG_CFG5 Register (page = 0x01, address = 0x4B) [reset = 0h]
  10. Responding to a Fault
    1. 7.1 INT_CFG Register (page = 0x00, address = 0x42) [reset = 0b]
      1. 7.1.1 DIAG_CFG10 Register (page = 0x01, address = 0x50) [Reset = 0x88]
    2. 7.2 Manual Recovery Sequence
    3. 7.3 Recommended Fault Register Read Sequence
  11. Using PurePath Console
    1. 8.1 Advanced Tab
    2. 8.2 Diagnostics Walk-through
      1. 8.2.1 Diagnostics Configuration
      2. 8.2.2 Debounce Configuration
      3. 8.2.3 Latched Fault Status
  12. Diagnostic Monitoring Registers
    1. 9.1 Voltage Measurements
    2. 9.2 MICBIAS Load Current
    3. 9.3 Internal Die Temperature
  13. 10Summary
  14. 11References

Clearing Latched Registers

Most of the latched registers in the device are self-clearing and reset upon reading as previously described. However, the mapping of some registers causes the registers to clear only when another latched register is read. Registers that exhibit this behavior include a description in the register map stating which register needs to be read for the bit to clear. This behavior applies to the INxM short to VBAT_IN faults in the channel latch registers as well as the INxP and INxM overvoltage status bits in INT_LTCH1. Reading all latched registers any time a fault is detected is recommended to verify all bits are cleared. To verify no faults are missed, a recommended read sequence is provided in Section 7.3.