9 Revision History
Changes from Revision D (February 2020) to Revision E (September 2025)
- Updated
the numbering format for tables, figures, and
cross-references throughout the
documentGo
- Updated RθJA metric from 55.6°C/W to
84.6°C/WGo
- Updated RθJC(top) metric from 84.6°C/W to
55.6°C/WGo
Changes from Revision C (November 2016) to Revision D (February 2020)
- Added "keep total REFOUT capacitance below 0.47μF" in Pin Functions
tableGo
Changes from Revision B (September 2016) to Revision C (November 2016)
- Added references to DDR3L DRAM technology throughoutGo
- Added DDR3L test conditions to Output DC voltage, VO and
REFOUT specificationGo
- Added Figure 5-4
Go
- Added Figure 5-9
Go
- Updated Figure 5-16 to include DDR3L dataGo
Changes from Revision A (September 2015) to Revision B (May 2016)
- Changed " –10mA < IREFOUT < 10mA" to "–1mA <
IREFOUT < 1mA" in all test conditions for the REFOUT
voltage tolerance to VREFIN
specificationGo
- Changed all MIN and MAX values from "15" to "12" for all test
conditions for the REFOUT voltage tolerance to VREFIN
specificationGo
- Updated Figure 6-1
Go
- Added
Section 6.3.12
sectionGo
- Updated Figure 7-5 and Table 7-2
Go
- Added clarity to
Section 7.5.1
section.Go
Changes from Revision * (February 2008) to Revision A (September 2015)
- Added Pin Configuration and Functions section, ESD Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section.Go
- Changed “PowerPAD” references to “thermal pad” throughout Go
- Deleted Dissipation Ratings table Go