SPVA018 August 2025 LM2904B
In many system level designs, testing is performed while op amps are powered off to confirm all components are working. When testing op amps, a voltage or current is applied to the inputs, and the resistance is measured. Depending on the internal diode structure, a wide spectrum of results are viable. The resistance that is being measured is the resistance of the ESD cell(s) inside of the op amp. However, there are a few key parameters that must be followed during a system level test to make sure there is a valid measurement, and that the op amp is not damaged in this test.
The first step is making sure that the device is not powered on. The next step is to ground the supplies of the device. Figure 6-1 shows a valid in circuit test setup for an op amp.
Consider the following example: an op amp has a voltage placed on the inputs, while the supplies are left floating. Since the supplies are floating, the voltage has no path to the absorption device. This can lead to unintentionally powering the device on, creating undesired output signals, which can affect other devices in the system. Therefore, best practice is to ground both supplies when verifying device in a system level test. For more details on back-powering an amplifier, see this application note.