SPVA018 August   2025 LM2904B

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2ESD Overview
    1. 2.1 What is Electrostatic Discharge?
      1. 2.1.1 ESD Cell Robustness in Semiconductors
  6. 3Types of ESD Cells
    1. 3.1 Dual Diode Configuration
      1. 3.1.1 Why Not Always Use Dual Diode Configuration?
    2. 3.2 Bootstrapped Diodes
    3. 3.3 Absorption Devices
      1. 3.3.1 Active Clamps
      2. 3.3.2 GCNMOS Clamps
    4. 3.4 Silicon Controlled Rectifiers
    5. 3.5 CER and ECR NPN Diodes
      1. 3.5.1 Measuring the Response of an ECR and CER ESD Cell
    6. 3.6 Comparison of ESD Cells
  7. 4How to Determine the ESD Structure of the Device from the Data Sheet
  8. 5How to Protect The System from In Circuit ESD/EOS Events
    1. 5.1 Using TVS Diodes and Series Resistance for Circuit Protection
    2. 5.2 Using Schottky Diodes for Circuit Protection
  9. 6How to Test an Op Amp in a System Level Circuit
    1. 6.1 ESD Protection Cell Advancements Over the Years
  10. 7Summary
  11. 8References

3.3.2 GCNMOS Clamps

Gate-coupled NMOS (GCNMOS) clamps are another common form of an absorption device. The gate of the NMOS is connected to an RC trigger circuit that is pulled high during an ESD event. Generally, the response time of the circuit is less than 10ns. These clamps have similar advantages and disadvantages as the active clamp, with size being a major factor, as well as the lower clamping voltage.

GCNMOS Clamp Figure 3-6 GCNMOS Clamp

Both the active clamp and GCNMOS clamp are considered forms of snapback protection structures. The next section focuses on other forms of snapback ESD protection cells.