CD4029B CMOS Presettable Up/Down Counter |

CD4029B (ACTIVE) CMOS Presettable Up/Down Counter

CMOS Presettable Up/Down Counter - CD4029B


CD4029B consists of a four-stage binary or BCD-decade up/down counter with provisions for look-ahead carry in both counting modes. The inputs consist of a single CLOCK, CARRY-IN\ (CLOCK ENABLE\), BINARY/DECADE, UP/DOWN, PRESET ENABLE, and four individual JAN signals, Q1, Q2, Q3, Q4 and a CARRY OUT\ signal are provided as outputs.

A high PRESET ENABLE signal allows information on the JAM INPUTS to preset the counter to any state asynchronously with the clock. A low on each JAM line, when the PRESET-ENABLE signal is high, resets the counter to its zero count. The counter is advanced one count at the positive transition of the clock when the CARRY-IN\ and PRESET ENALBE signals are low. Advancement is inhibited when the CARRY-IN\ or PRESET ENABLE signals are high. The CARRY-OUT\ signal is normally high and goes low when the counter reaches its maximum count in the UP mode or the minimum count in the DOWN mode provided the CARRY-IN\ signal is low. The CARRY-IN\ signal in the low state can thus be considered a CLOCK ENABLE\. The CARRY-IN\ terminal must be connected to VSS when not in use.

Binary counting is accomplished when the BINARY/DECADE input is high; the counter counts in the decade mode when the BINARY/DECADE input is low. The counter counts up when the UP/DOWN input is high, and down when the UP/DOWN input is low. Multiple packages can be connected in either a parallel-clocking or a ripple-clocking arrangement as shown in Fig. 17.

Parallel clocking provides synchronous control and hence faster response from all counting outputs. Ripple-clocking allows for longer clock input rise and fall times.

The CD4029B-series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).


  • Medium-speed operation… 8 MHz (typ.) @ CL = 50 pF and VDD–VSS = 10 V
  • Multi-package parallel clocking for synchronous high speed output response or ripple clocking for slow clock input rise and fall times
  • "Preset Enable" and individual "Jam" inputs provided
  • Binary or decade up/down counting
  • BCD outputs in decade mode
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized, symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Programmable binary and decade counting/frequency synthesizers-BCD output
    • Analog to digital and digital to analog conversion
    • Up/Down binary counting
    • Magnitude and sign generation
    • Up/Down decade counting
    • Difference counting


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Part number Order Technology Family VCC (Min) (V) VCC (Max) (V) Bits (#) Voltage (Nom) (V) F @ nom voltage (Max) (MHz) ICC @ nom voltage (Max) (mA) tpd @ nom Voltage (Max) (ns) IOL (Max) (mA) IOH (Max) (mA) Function Type Rating Operating temperature range (C) Package Group
CD4029B Order now CD4000     3     18     4     5
8     0.03     260     1.5     -1.5     Counter     Binary
Catalog     -55 to 125     PDIP | 16
SOIC | 16
SO | 16
TSSOP | 16