DS125DF1610

• Pin-Compatible Family
  • DS150DF1610: 12.5 to 15 G
  • DS125DF1610: 9.8 to 12.5 G
  • DS110DF1610: 8.5 to 11.3 G
• 4x4 Analog Cross Point Switch for Each Quad
• Fully Adaptive CTLE
• Self tuning DFE, with Optional Continuous Adaption
• Configurable VGA
• Adjustable Transmit V_OD
• Adjustable 3-tap Transmit FIR Filter
• On-chip AC Coupling on Receive Inputs
• Locks to Half/Quarter/Eighth Data Rates for Legacy Support
• On-chip Eye Monitor(EOM), PRBS Checker, Pattern Generator
• Supports JTAG Boundary Scan
• Programmable Output Polarity Inversion
• Input Signal Detection, CDR Lock Detection
• Single 2.5 V ±5% Power Supply
• SMBus Based Register Configuration
• Optional EEPROM Configuration
• 15 mm × 15 mm, 196-pin FCBGA Package
• Operating Temp Range : –40°C to +85°C

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The DS125DF1610 is a sixteen-channel multi-rate retimer with integrated signal conditioning features. The device includes a fully adaptive Continuous Time Linear Equalizer (CTLE), Decision Feedback Equalizer (DFE), clock and data recovery (CDR), and a transmit FIR filter to enhance the reach and robustness over long, lossy, crosstalk impaired high speed serial links to achieve BER < 1×10^-15.

Each channel of the DS125DF1610 independently locks to serial data at 9.8 to 12.5 Gbps and the divide by 2, 4 and 8 sub-multiples. A simple external oscillator (±100ppm) that is synchronous or asynchronous with the incoming data stream is used as a reference clock. Integrated 4x4 cross point switches allow for full non-blocking routing or broadcasting within each quad of the DS125DF1610.

Programmable transmit FIR filter offers control of the pre-cursor, main tap and post-cursor for transmit equalization. The fully adaptive receive equalization (CTLE and DFE) enables longer distance transmission in lossy copper interconnects and backplanes with multiple connectors.

A non-disruptive mission mode eye-monitor feature allows link monitoring internal to the receiver. The built-in PRBS generator and checker compliment the internal diagnostic features to complete standalone BERT measurements. Built-in JTAG enables manufacturing tests.