SN74AHCT00-EP

ACTIVO

Puertas NAND de 4 canales, 2 entradas, 4.5 V a 5.5 V con entradas CMOS compatibles con TTL de produc

Haga su pedido ahora

Hoja de datos

document-pdfAcrobat SN74AHCT00-EP datasheet (Inglés)

SN74AHCT00-EP

ACTIVO

Hoja de datos

Haga su pedido ahora

Detalles del producto

Technology family

AHCT

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

8

IOH (max) (mA)

-8

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

70

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Technology family

AHCT

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

8

IOH (max) (mA)

-8

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

70

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

TSSOP (PW)

14

32 mm² (5 mm × 6.4 mm)

SOIC (D)

14

51.9 mm² (8.65 mm × 6 mm)

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Inputs Are TTL-Voltage Compatible
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetalliclife, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Inputs Are TTL-Voltage Compatible
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetalliclife, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The ’AHCT00 device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

filter

Buscar otro/a Puertas NAND

Descargar

Documentación técnica

No se encontraron resultados. Borre su búsqueda y vuelva a intentarlo.

Ver todo 4

Documentación principal	Tipo	Título	Fecha
*	Hoja de datos	SN74AHCT00-EP datasheet	5/06/2003
*	Informe de radiación y confiabilidad	SN74AHCT00MPWREP Reliability Report	8/01/2016
*	Informe de radiación y confiabilidad	SN74AHCT00MDREP Reliability Report	8/01/2016
*	VID	SN74AHCT00-EP VID V6203653	21/06/2016

SN74AHCT00-EP

Puertas NAND de 4 canales, 2 entradas, 4.5 V a 5.5 V con entradas CMOS compatibles con TTL de produc

SN74AHCT00-EP

Detalles del producto

Documentación técnica

Pedidos y calidad

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI