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TPS7H3014-SP

ACTIVO

Secuenciador de fuente de alimentación de 4 canales QMLV de 14 V resistente a la radiación

Detalles del producto

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Supply voltage (max) (V) 14 Supply voltage (min) (V) 3 Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

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Documentación técnica

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Tipo Título Fecha
* Data sheet TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML 27 jul 2025
* SMD TPS7H3014-SP SMD 5962-23201 20 jun 2024
* Radiation & reliability report TPS7H3014-SP Single-Event Effects (SEE) PDF | HTML 12 jun 2024
* Radiation & reliability report TPS7H3014-SP Neutron Displacement Damage (NDD) Characterization Report 04 abr 2024
* Radiation & reliability report TPS7H3014-SP Total Ionizing Dose (TID) Report 04 abr 2024
Application brief DLA Approved Optimizations for QML Products (Rev. C) PDF | HTML 17 jun 2025
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. B) PDF | HTML 10 jun 2025
Selection guide TI Space Products (Rev. K) 04 abr 2025
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 20 feb 2025
Application note QML flow, its importance, and obtaining lot information (Rev. C) 30 ago 2023
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 21 ago 2020
E-book Radiation Handbook for Electronics (Rev. A) 21 may 2019

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

TPS7H3014EVM-CVAL — Módulo de evaluación TPS7H3014-SP

El TPS7H3014EVM-CVAL muestra el funcionamiento de un único secuenciador TPS7H3014-SP. La placa proporciona espacios que se pueden rellenar con componentes adicionales para permitir la prueba de configuraciones personalizadas, como secuenciadores de cadena margarita.
Guía del usuario: PDF | HTML
Placa de evaluación

ALPHA-3P-VB630-SPACE-AMD — El kit Alpha Data ADM-VB630 con AMD Versal edge XQRVE2302 ACAP y productos de TI tolerantes a la rad

Se trata de un factor de forma VPX 3U que destaca el SoC/FPGA adaptable AMD-Xilinx® Versal AI Edge XQRVE2302. El ADM-VB630 es una placa de computadoras de una sola placa. La mayoría de los componentes son una gama de alimentación, interfaz, reloj y procesamiento integrado (-SEP) de administración (...)

Modelo de simulación

TPS7H3014-SP and TPS7H3014-SEP PSpice Transient Model

SNVMCF1.ZIP (72 KB) - PSpice Model
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® para TI es un entorno de diseño y simulación que ayuda a evaluar la funcionalidad de los circuitos analógicos. Esta completa suite de diseño y simulación utiliza un motor de análisis analógico de Cadence®. Disponible sin ningún costo, PSpice para TI incluye una de las bibliotecas de modelos (...)
Diseños de referencia

TIDA-050088 — Diseño de referencia de potencia tolerante a la radiación para Versal AI Edge

Se trata de un diseño de referencia de arquitectura de potencia tolerante a la radiación para Versal™ AI Edge XQRVE2302 de AMD. El Versal Edge es un sistema en chip (SoC) adoptivo para aplicaciones espaciales que permite altos niveles de rendimiento en un factor de forma pequeño. Un suministro de (...)
Design guide: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
CFP (HFT) 22 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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