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TPS7H3014-SP

ACTIVO

Radiation-hardened, QML-V, 14V four-channel power-supply sequencer

Detalles del producto

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
CFP (HFT) 22 60.221856 mm² (6.211 mm × 9.696 mm)
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

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Documentación principal Tipo Título Opciones de formato Descargar la versión más reciente en inglés Fecha
* Hoja de datos TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML 27/07/2025
* Informe de radiación y confiabilidad TPS7H3014-SP and TPS7H3014-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) 29/07/2026
* Informe de radiación y confiabilidad TPS7H3014-SP Single-Event Effects (SEE) PDF | HTML 12/06/2024
* Informe de radiación y confiabilidad TPS7H3014-SP Neutron Displacement Damage (NDD) Characterization Report 4/04/2024
* SMD TPS7H3014-SP SMD 5962-23201 20/06/2024
Guía de selección TI Space Products (Rev. L) 27/03/2026
Nota sobre la aplicación Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form (Rev. A) PDF | HTML 5/11/2025
Application brief DLA Approved Optimizations for QML Products (Rev. C) PDF | HTML 17/06/2025
Nota sobre la aplicación Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. B) PDF | HTML 10/06/2025
Más documentación TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 20/02/2025
Nota sobre la aplicación QML flow, its importance, and obtaining lot information (Rev. C) 30/08/2023
Nota sobre la aplicación Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 19/10/2022
Nota sobre la aplicación DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 21/08/2020
Libro electrónico Radiation Handbook for Electronics (Rev. A) 21/05/2019

Diseño y desarrollo

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