ISOS510-SEP
- Radiation Performance
- Total Ionizing Dose (TID) Characterized (ELDRS-Free) up to 50krad(Si)
- TID RLAT up to 30krad(Si)
- Single-Event Latch-up (SEL) Immune to LET up to 43MeV-cm2/mg at 125℃
- Single-event functional interrupt (SEFI) and single-event transient (SET) characterized LET up to 43MeV-cm2/mg
- Space Enhanced Plastic (Space EP)
- Meets NASA ASTM E595 Outgassing Spec
- Military Temp Range (-55℃ to 125℃)
- 1-channel diode input
- Current transfer ratio (CTR) at IF = 5mA, VCE = 5V: 100% to 155%
- High collector-emitter voltage: VCE (max) = 30V
- Robust SiO2 isolation barrier
- Isolation rating: 3750VRMS
- Working voltage: 500VRMS, 707VPK
- Surge capability: up to 10kV
- Response time: 3µs (typical) at VCE = 10V, IC = 2mA, RL = 100Ω
- Small 4-pin package (DFG)
- Safety-related certifications:
- UL 1577 recognition
- DIN EN IEC 60747-17 (VDE 0884-17) conformity per VDE
The ISOS510 radiation-tolerant device is a single-channel, current-driven, analog isolator with transistor output. The device offers significant reliability and performance advantages compared to other current-driven analog isolators, including high bandwidth, low turn-off delay, low power consumption, wider temperature ranges, flat current transfer ratio (CTR), and tight process controls resulting in small part-to-part skew. These performance advantages stay stable across radiation, temperature, and lifetime.
ISOS510 is offered in small a SOIC-4 package with 2.54mm pin pitch, supporting a 3.75kVRMS isolation rating . The high performance and reliability of ISOS510 enables these devices to be used in aerospace & defense applications such as feedback loops in isolated DC/DC modules, satellite propulsion power processing units, spacecraft battery management systems, and more.
기술 자료
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | ISOS510-SEP Radiation Tolerant , Current-Driven Analog Isolator With Transistor Output datasheet | PDF | HTML | 2025/08/01 |
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
ISOM-EVM — 범용 옵토 에뮬레이터 평가 모듈
| 패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
|---|---|---|
| SOIC (DFG) | 4 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치
권장 제품에는 본 TI 제품과 관련된 매개 변수, 평가 모듈 또는 레퍼런스 디자인이 있을 수 있습니다.