홈 로직 및 전압 변환 로직 게이트 AND 게이트
홈
로직 및 전압 변환
로직 게이트
AND 게이트

SN74AC08-EP

구형

향상된 제품, 4채널, 2입력 2V~6V 고속(7ns) 24mA 드라이브 강도 AND 게이트

지금 주문
데이터 시트

SN74AC08-EP

구형
데이터 시트 지금 주문

제품 상세 정보

Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 100 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 14 51.9 mm² 8.65 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of −55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree†
  • 2-V to 6-V V CC Operation
  • Inputs Accept Voltages to 6 V
  • Max t pd of 7.5 ns at 5 V

(1)† Component qualification in accordance with JEDEC and industry standards to provide reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.

The SN74AC08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = A + B in positive logic.
filter 기타 AND 게이트 찾기
다운로드

기술 자료

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2개 모두 보기
유형 직함 날짜
* Data sheet SN74AC08-EP Quadruple 2-Input Positive-and Gate datasheet (Rev. A) PDF | HTML 2023/06/28
* Radiation & reliability report SN74AC08MDREP Reliability Report 2012/06/04

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치