홈 로직 및 전압 변환 로직 게이트 NAND 게이트
홈
로직 및 전압 변환
로직 게이트
NAND 게이트

SN74ALVC00-EP

활성

향상된 제품 4채널, 2입력, 1.65V~3.6V NAND 게이트

지금 주문
데이터시트

SN74ALVC00-EP

활성
데이터시트 지금 주문

제품 상세 정보

Technology family ALVC Supply voltage (min) (V) 1.65 Supply voltage (max) (V) 3.6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 150 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
Technology family ALVC Supply voltage (min) (V) 1.65 Supply voltage (max) (V) 3.6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 24 IOH (max) (mA) -24 Input type Standard CMOS Output type Push-Pull Features Ultra high speed (tpd <5ns) Data rate (max) (Mbps) 150 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
SOIC (D) 14 51.9 mm² 8.65 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015;
    Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
  • Operates From 1.65 V to 3.6 V
  • Max tpd of 3 ns at 3.3 V
  • ±24-mA Output Drive at 3.3 V
  • Latch-Up Performance Exceeds 250 mA Per JESD 17

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015;
    Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
  • Operates From 1.65 V to 3.6 V
  • Max tpd of 3 ns at 3.3 V
  • ±24-mA Output Drive at 3.3 V
  • Latch-Up Performance Exceeds 250 mA Per JESD 17

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74ALVC00 quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.

The device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

The SN74ALVC00 quadruple 2-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.

The device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.
open-in-new 기타 NAND 게이트 찾기
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기술 문서

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모두 보기19
유형 직함 날짜
* Data sheet SN74ALVC00-EP datasheet (Rev. A) 2004/05/20
* VID SN74ALVC00-EP VID V6204685 2016/06/21
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002/08/29
User guide ALVC Advanced Low-Voltage CMOS Including SSTL, HSTL, And ALB (Rev. B) 2002/08/01
More literature Standard Linear & Logic for PCs, Servers & Motherboards 2002/06/13
Application note 16-Bit Widebus Logic Families in 56-Ball, 0.65-mm Pitch Very Thin Fine-Pitch BGA (Rev. B) 2002/05/22
Application note Benefits & Issues of Migrating 5-V and 3.3-V Logic to Lower-Voltage Supplies (Rev. A) 1999/09/08
Application note TI SN74ALVC16835 Component Specification Analysis for PC100 1998/08/03
Application note Logic Solutions for PC-100 SDRAM Registered DIMMs (Rev. A) 1998/05/13
Application note Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 1997/12/01
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997/08/01
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 1997/06/01
Application note Input and Output Characteristics of Digital Integrated Circuits 1996/10/01
Application note Live Insertion 1996/10/01
Application note Understanding Advanced Bus-Interface Products Design Guide 1996/05/01

설계 및 개발

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패키지 핀 다운로드
SOIC (D) 14 옵션 보기
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주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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