홈 데이터 컨버터 아날로그-디지털 컨버터(ADC) 정밀 ADC
홈
데이터 컨버터
아날로그-디지털 컨버터(ADC)
정밀 ADC

TLC2543-EP

활성

직렬 제어 및 11개의 아날로그 입력을 지원하는 향상된 제품 12비트 아날로그-디지털 컨버터(ADC)

지금 주문하기
데이터 시트

TLC2543-EP

활성
데이터 시트 지금 주문하기

제품 상세 정보

Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply voltage (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² (12.8 mm × 10.3 mm) SSOP (DB) 20 56.16 mm² (7.2 mm × 7.8 mm)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
filter 기타 정밀 ADC 찾기
다운로드 스크립트와 함께 비디오 보기 비디오

관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 유사한 기능.
ADS1278-EP 활성 개선된 제품 8진, 144kHz, 동시 샘플링 24비트 델타 시그마 ADC Higher resolution, higher speed, lower channel count, different architecture
ADS1258-EP 활성 EP(Enhanced Product) 16채널 24비트 아날로그-디지털 컨버터(ADC) Higher speed, higher channel count

기술 자료

검색된 결과가 없습니다. 검색어를 지우고 다시 시도하세요.
6개 모두 보기
상위 문서 유형 직함 형식 옵션 최신 영어 버전 다운로드 날짜
* 데이터 시트 TLC2543-EP datasheet (Rev. A) 2006. 11. 2
* 방사능 및 안정성 보고서 TLC2543MDBREP Reliability Report 2016. 2. 16
* 방사능 및 안정성 보고서 TLC2543QDWREP Reliability Report 2014. 12. 22
* VID TLC2543-EP VID V6203614 2016. 6. 21
e북 Best of Baker's Best: Precision Data Converters -- SAR ADCs 2015. 5. 21
애플리케이션 노트 Determining Minimum Acquisition Times for SAR ADCs, part 2 2011. 3. 17

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

설계 툴

ADC-DAC-TO-VREF-SELECT-DESIGN-TOOL — The ADC-TO-VREF-SELECT tool enables the pairing of TI ADCs, DACs, and series voltage references.

The ADC-TO-VREF-SELECT tool enables the pairing of TI analog-to-digital converters (ADCs) and series voltage references. Users can select an ADC device and the desired reference voltage, and the tool will list up to two voltage reference recommendations.
지원되는 제품 및 하드웨어
패키지 핀 CAD 기호, 풋프린트 및 3D 모델
SOIC (DW) 20 Ultra Librarian
SSOP (DB) 20 Ultra Librarian
TI의 평가 항목에 대한 표준 약관이 적용됩니다.

주문 및 품질

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지원 및 교육

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포럼 주제 모두 보기(영문)

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