홈 데이터 컨버터 디지털-아날로그 컨버터(DAC) 정밀 DAC(≤10 MSPS)
홈
데이터 컨버터
디지털-아날로그 컨버터(DAC)
정밀 DAC(≤10 MSPS)

TLV5638-EP

활성

향상된 제품 12비트, 1uS 직렬 입력 듀얼 DAC, 프로그래머블 내부 레퍼런스, 안정 시간

지금 주문
데이터 시트

이 제품의 최신 버전이 있습니다

open-in-new 대안 비교
비교 대상 장치와 유사한 기능
DAC63002 활성 Hi-Z, EEPROM, 파형 생성기를 갖춘 12비트, 2채널 저전력 전압/전류 출력 스마트 DAC Low power with VOUT and IOUT and smaller package

TLV5638-EP

활성
데이터 시트 지금 주문

제품 상세 정보

Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (µs) 1 Reference type Ext, Int Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.233 Power consumption (typ) (mW) 4.5 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (µs) 1 Reference type Ext, Int Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.233 Power consumption (typ) (mW) 4.5 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Internal Reference
  • Programmable Settling Time:
       1 µs in Fast Mode,
       3.5 µs in Slow Mode
  • Compatible With TMS320 and SPI™ Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Internal Reference
  • Programmable Settling Time:
       1 µs in Fast Mode,
       3.5 µs in Slow Mode
  • Compatible With TMS320 and SPI™ Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.

The TLV5638 is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface allows glueless interface to TMS320 and SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed vs power dissipation. With its on-chip programmable precision voltage reference, the TLV5638 simplifies overall system design.

Because of its ability to source up to 1 mA, the reference can also be used as a system reference. Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package to reduce board space.

The TLV5638 is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface allows glueless interface to TMS320 and SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed vs power dissipation. With its on-chip programmable precision voltage reference, the TLV5638 simplifies overall system design.

Because of its ability to source up to 1 mA, the reference can also be used as a system reference. Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package to reduce board space.
filter 기타 정밀 DAC(≤10 MSPS) 찾기
다운로드

기술 자료

star =TI에서 선정한 이 제품의 인기 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
2개 모두 보기
유형 직함 날짜
* Radiation & reliability report TLV5638MDREP Reliability Report 2014/12/22
* Data sheet 2.7V-5.5V Low-Power Dual 12By Digital-To-Analog Converter w/Int Ref & Power Down datasheet (Rev. B) 2003/12/05

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

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포럼 주제 모두 보기(영문)

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