홈 전원 관리 선형 및 저손실(LDO) 레귤레이터
홈
전원 관리
선형 및 저손실(LDO) 레귤레이터

TPS7H1210-SEP

활성

우주 항공 강화 플라스틱의 방사능 내성, -3V ~ -16.5V 입력, 1A, 음극 선형 레귤레이터

지금 주문
데이터시트

TPS7H1210-SEP

활성
데이터시트 지금 주문

제품 상세 정보

Output options Adjustable Output, Negative Output Iout (max) (A) 1 Vin (max) (V) -3 Vin (min) (V) -16.5 Vout (max) (V) -1.2 Vout (min) (V) -15.5 Noise (µVrms) 13.7 Iq (typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft start Accuracy (%) 2 PSRR at 100 KHz (dB) 61 Dropout voltage (Vdo) (typ) (mV) 363 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 43 Radiation, TID (typ) (krad) 30
Output options Adjustable Output, Negative Output Iout (max) (A) 1 Vin (max) (V) -3 Vin (min) (V) -16.5 Vout (max) (V) -1.2 Vout (min) (V) -15.5 Noise (µVrms) 13.7 Iq (typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft start Accuracy (%) 2 PSRR at 100 KHz (dB) 61 Dropout voltage (Vdo) (typ) (mV) 363 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 43 Radiation, TID (typ) (krad) 30
VQFN (RGW) 20 25 mm² 5 x 5
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.
open-in-new 기타 선형 및 저손실(LDO) 레귤레이터 찾기
다운로드 스크립트와 함께 비디오 보기 동영상

관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 유사한 기능
TPS73801-SEP 활성 비닐 포장에 들어 있는 내방사성 2.2V~20V 출력, 1A 조정식 LDO 레귤레이터 Space enhanced plastic LDO regulator for positive power supplies
신규 TPS7H1111-SEP 활성 방사능 내성, 1.5A, 초저잡음, 초고 PSRR RF LDO 레귤레이터 Space enhanced plastic LDO regulator with extremely low noise, high PSRR and low input/output voltage.

기술 문서

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모두 보기14
유형 직함 날짜
* Data sheet TPS7H1210-SEP –16.5-V, 1-A, Negative Linear Regulator in Space Enhanced Plastic datasheet PDF | HTML 2021/11/23
* VID TPS7H1210-SEP VID V62-21616 2022/01/04
* Radiation & reliability report TPS7H1210-SEP Single-Event Effects (SEE) Test Report 2021/12/13
* Radiation & reliability report TPS7H1210-SEP Neutron Displacement Damage (NDD) Characterization 2021/11/24
* Radiation & reliability report TPS7H1210-SEP Total Ionizing Dose (TID) 2021/11/24
* Radiation & reliability report TPS7H1210-SEP Production Flow and Reliability Report PDF | HTML 2021/11/08
Technical article 우주 항공 강화 제품이 저지구 궤도 애플리케이션의 과제를 해결하는 방법 (Rev. A) PDF | HTML 2024/01/11
White paper Parallel LDO Architecture Design Using Ballast Resistors PDF | HTML 2022/12/14
White paper Comprehensive Analysis and Universal Equations for Parallel LDO's Using Ballast PDF | HTML 2022/12/13
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 2022/09/15
Selection guide TI Space Products (Rev. I) 2022/03/03
User guide TPS7H1210EVM User's Guide PDF | HTML 2021/11/22
Certificate TPS7H1210EVM EU RoHS Declaration of Conformity (DoC) 2021/10/04
E-book Radiation Handbook for Electronics (Rev. A) 2019/05/21

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

TPS7H1210EVM — TPS7H1210-SEP -3V ~ -16.5V 입력, 1A, 음극 선형 레귤레이터용 평가 모듈

TPS7H1210 평가 모듈(EVM)은 TPS7H1210-SEP 우주 항공 강화, 저손실(LDO), 음극 전압 리니어 레귤레이터를 평가하기 위한 엔지니어링 데모 보드입니다.

사용 설명서: PDF | HTML
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시뮬레이션 모델

TPS7H1210-SEP PSpice Transient Model

SBVM985.ZIP (23 KB) - PSpice Model
다운로드
레퍼런스 디자인

TIDA-010274 — Space-grade discrete RF sampling transceiver reference design

This reference design incorporates a 10 GSPS dual digital-to-analog converter and a 5 GSPS dual analog-to-digital converter with active baluns on the RF interface supporting up through X-band. The design also incorporates a space-grade clocking daughter card and a space-grade power solution (...)
Design guide: PDF
패키지 핀 다운로드
VQFN (RGW) 20 옵션 보기
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주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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