AFE1256
- 256 Channels
- On-Chip, 16-Bit ADC
- Photodiode Short Immunity
- Column Short Immunity
- High Performance:
- Noise: 758 e-RMS with 28-pF Sensor
Capacitor in 1.2-pC Range - Integral Nonlinearity:
±2 LSB with Internal 16-Bit ADC - Minimum Scan Time:
- 37.9 µs in Normal Mode
- 20 µs in 2x Binning Mode
- Noise: 758 e-RMS with 28-pF Sensor
- Integration:
- Eight Selectable Full-Scale Ranges:
0.15 pC (Min) to 9.6 pC (Max) - Built-In Correlated Double Sampler
- 2x Binning (Averages Charge of Two Adjacent
Channels) for Faster Throughput - Pipelined Integrate and Read: Allows Data
Read During Integration
- Eight Selectable Full-Scale Ranges:
- Flexibility:
- Electron and Hole Integration
- Low Power:
- 2.9 mW/Ch with ADC
- 2.3 mW/Ch without ADC
- 0.1 mW/Ch in Nap Mode
- Total Power-Down Feature
- 22-mm × 5-mm Gold-Bump Die,
Suitable for TCP and COF
Application
- Flat-Panel, X-Ray Detector
All trademarks are the property of their respective owners.
The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.
Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.
The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.
To request a full data sheet or other design resources: request AFE1256
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | AFE1256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. D) | PDF | HTML | 2016年 5月 26日 |
Analog Design Journal | Selecting a multichannel ultra-low-current measurement IC | PDF | HTML | 2022年 3月 18日 | |
EVM User's guide | AFE1256COF EVM Introduction User Guide | 2013年 11月 5日 |
設計與開發
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AFE1256EVM — 適用於平板數位 X 光偵測器的 AFE1256 256 通道 AFE 評估模組
The AFE1256EVM is a compact USB based evaluation kit for evaluating the AFE1256 COF, a 256-channel analog front-end. The EVM is self-contained with DACs and on board pattern generator built , greatly reducing its dependency on external equipment so all it needs is a power supply. The kit consists (...)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
COF (TDS) | 314 | Ultra Librarian |
DIESALE (TD) | — |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。