SN54SC8T165-SEP
- Vendor item drawing available, VID V62/25625-01XE
- Radiation - Total Ionizing Dose
(TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
- Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
-
Wide operating range of 1.2V to 5.5V
-
Single-supply voltage translator:
-
Up translation:
-
1.2V to 1.8V
-
1.5V to 2.5V
-
1.8V to 3.3V
-
3.3V to 5.0V
-
-
Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
-
- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 250mA per JESD 17
- Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
The SN54SC8T165-SEP device is a parallel- or serial-in, serial-out 8-bit shift register. This device has two modes of operation: load data, and shift data which are controlled by the SH/LD input. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).
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技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | SN54SC8T165-SEP Radiation Tolerant, Parallel-Load 8-Bit Shift Registers datasheet | PDF | HTML | 2025/1/20 | ||
| * | 輻射及可靠性報告 | SN54SC8T165-SEP Single-Event Effects (SEE) Radiation Report | PDF | HTML | 2025/2/21 | ||
| * | 輻射及可靠性報告 | SN54SC8T165-SEP Production Flow and Reliability Report | PDF | HTML | 2025/2/20 | ||
| * | 輻射及可靠性報告 | SN54SC8T165-SEP Total Ionizing Dose (TID) Report | 2025/2/19 |
設計與開發
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