SN74LVC573A-EP

現行

具有 3 態輸出的增強型產品八路 D 型透明鎖存

立即訂購

產品規格表

document-pdfAcrobat SN74LVC573A-EP datasheet (Rev. A) (英文)

SN74LVC573A-EP

現行

產品規格表

立即訂購

產品詳細資料

Number of channels

8

Technology family

LVC

Input type

Standard CMOS

Output type

3-State

Clock frequency (max) (MHz)

100

IOL (max) (mA)

24

IOH (max) (mA)

-24

Supply current (max) (µA)

10

Features

Balanced outputs, Flow-through pinout, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns)

Operating temperature range (°C)

-40 to 125

Rating

HiRel Enhanced Product

Number of channels

8

Technology family

LVC

Input type

Standard CMOS

Output type

3-State

Clock frequency (max) (MHz)

100

IOL (max) (mA)

24

IOH (max) (mA)

-24

Supply current (max) (µA)

10

Features

Balanced outputs, Flow-through pinout, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns)

Operating temperature range (°C)

-40 to 125

Rating

HiRel Enhanced Product

TSSOP (PW)

20

41.6 mm² (6.5 mm × 6.4 mm)

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operates From 2 V to 3.6 V
Inputs Accept Voltages to 5.5 V
Max t_pd of 6.9 ns at 3.3 V
Typical V_OLP (Output Ground Bounce)
<0.8 V at V_CC = 3.3 V, T_A = 25°C
Typical V_OHV (Output V_OH Undershoot)
>2 V at V_CC = 3.3 V, T_A = 25°C
Supports Mixed-Mode Signal Operation on All Ports (5-V Input/Output Voltage With 3.3-V V_CC)
I_off Supports Partial-Power-Down Mode Operation

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operates From 2 V to 3.6 V
Inputs Accept Voltages to 5.5 V
Max t_pd of 6.9 ns at 3.3 V
Typical V_OLP (Output Ground Bounce)
<0.8 V at V_CC = 3.3 V, T_A = 25°C
Typical V_OHV (Output V_OH Undershoot)
>2 V at V_CC = 3.3 V, T_A = 25°C
Supports Mixed-Mode Signal Operation on All Ports (5-V Input/Output Voltage With 3.3-V V_CC)
I_off Supports Partial-Power-Down Mode Operation

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74LVC573A-EP octal transparent D-type latch is designed for 2.7-V to 3.6-V V_CC operation.

This device features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. It is particularly suitable for implementing buffer registers, input/output (I/O) ports, bidirectional bus drivers, and working registers.

While the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the Q outputs are latched at the logic levels at the D inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without interface or pullup components.

OE\ does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

This device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.