TMAG5231 evaluation module for Hall-effect hinge


Order now


HALL-HINGE-EVM is designed with accompanying 3D-printed structures and magnet to evaluate TMAG5231B1 in a hinge-lid closure apparatus. This function is commonly used in laptop lid closures and other lid and door detection applications.

The design is compatible with the HALL-ADAPTER-EVM to allow broader testing of our magnetic sensing portfolio.

  • Demonstrates TMAG5231 in a hinged-lid closure application
  • Compatible with HALL-ADAPTER-EVM for evaluation of Hall-effect portfolio products
  • 3D-print source files are available for customization

  • Optional AAA battery holder
  • 1/8-inch cube NdFeB magnet (N42)
  • 3D-printed hinge assembly

Hall-effect latches & switches
TMAG5231 Low-power, low-voltage (1.65 V to 5.5 V) Hall-effect switch

Order & start development

Evaluation board

HALL-HINGE-EVM — TMAG5231 evaluation module for Hall-effect hinge

Log in to order
In stock / Out of stock
Not available on TI.com
TI's Standard Terms and Conditions for Evaluation Items apply.

Technical documentation

= Top documentation selected by TI
No results found. Please clear your search and try again.
View all 2
Type Title Date
* User guide Hall-Hinge-EVM User's Guide PDF | HTML 18 Feb 2022
Certificate HALL-HINGE-EVM EU RoHS Declaration of Conformity (DoC) 14 Feb 2022

Related design resources

Hardware development

HALL-ADAPTER-EVM Hall sensor breakout adapter evaluation module

Support & training

TI E2E™ forums with technical support from TI engineers

View all forum topics

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​