SLLSFW3A April   2025  – June 2025 SN55LVTA4-SEP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Unused Enable Pins
      2. 7.3.2 Driver Disabled Output
      3. 7.3.3 Driver Equivalent Schematics
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Typical Application
        1. 8.1.1.1 Detailed Design Procedure
          1. 8.1.1.1.1 Interconnecting Media
        2. 8.1.1.2 Design Requirements
        3. 8.1.1.3 Application Curve
      2. 8.1.2 Cold Sparing
      3. 8.1.3 Power Supply Recommendations
        1. 8.1.3.1 Supply Bypass Capacitance
      4. 8.1.4 Layout
        1. 8.1.4.1 Layout Guidelines
          1. 8.1.4.1.1 Microstrip vs. Stripline Topologies
          2. 8.1.4.1.2 Dielectric Type and Board Construction
          3. 8.1.4.1.3 Recommended Stack Layout
          4. 8.1.4.1.4 Separation Between Traces
          5. 8.1.4.1.5 Crosstalk and Ground Bounce Minimization
        2. 8.1.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Related Documentation
  11. 10Receiving Notification of Documentation Updates
  12. 11Support Resources
  13. 12Trademarks
  14. 13Electrostatic Discharge Caution
  15. 14Glossary
  16. 15Revision History
  17. 16Mechanical, Packaging, and Orderable Information

6 Parameter Measurement Information

SN55LVTA4-SEP Voltage and Current DefinitionsFigure 6-1 Voltage and Current Definitions
SN55LVTA4-SEP Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
A. All input pulses are supplied by a generator having the following characteristics: tr or tf 3 1ns, pulse repetition rate (PRR) = 50Mpps, pulse width = 10 ± 0.2ns
B. CL includes instrumentation and fixture capacitance within 6mm of the D.U.T.
Figure 6-2 Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
SN55LVTA4-SEP Test Circuit and Definitions for the Driver Common-Mode Output Voltage
A. All input pulses are supplied by a generator having the following characteristics: tr or tf 3 1ns, pulse repetition rate (PRR) = 50Mpps, pulse width = 10 ± 0.2ns
B. CL includes instrumentation and fixture capacitance within 6mm of the D.U.T.
C. The measurement of VOC(PP) is made on test equipment with a –3dB bandwidth of at least 300MHz
Figure 6-3 Test Circuit and Definitions for the Driver Common-Mode Output Voltage
SN55LVTA4-SEP Enable/Disable-Time Circuit and Definitions
A. All input pulses are supplied by a generator having the following characteristics: tr or tf < 1ns, pulse repetition rate (PRR) = 0.5Mpps, pulse width = 500 ± 10ns
B. CL includes instrumentation and fixture capacitance within 6mm of the D.U.T
Figure 6-4 Enable/Disable-Time Circuit and Definitions