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TMUX582F-SEP

VORSCHAU

Platzoptimiertes, ±60-V-geschütztes, 8:1-MUX mit einstellbaren Fehlerschwellen und mit Latch-Up-Immu

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Datenblatt

TMUX582F-SEP

VORSCHAU
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Produktdetails

Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 8, 12, 16, 20 Power supply voltage - dual (V) +/-10, +/-15, +/-5 Protocols Analog Ron (typ) (Ω) 180 CON (typ) (pF) 30 ON-state leakage current (max) (µA) 0.022 Supply current (typ) (µA) 0.14 Bandwidth (MHz) 150 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make, Fail-safe logic, Overvoltage protection, Powered-off protection Input/output continuous current (max) (mA) 5 Rating Space Drain supply voltage (max) (V) 16.5 Supply voltage (max) (V) 20
Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 8, 12, 16, 20 Power supply voltage - dual (V) +/-10, +/-15, +/-5 Protocols Analog Ron (typ) (Ω) 180 CON (typ) (pF) 30 ON-state leakage current (max) (µA) 0.022 Supply current (typ) (µA) 0.14 Bandwidth (MHz) 150 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make, Fail-safe logic, Overvoltage protection, Powered-off protection Input/output continuous current (max) (mA) 5 Rating Space Drain supply voltage (max) (V) 16.5 Supply voltage (max) (V) 20
TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • Radiation hardened
  • Single event latch-up (SEL) immune to 43 MeV-cm2/mg at 125°C
  • ELDRS free to 30 krad(Si)
  • Total ionizing dose (TID) RLAT for every wafer lot up to 20 krad(Si)
  • TID characterized up to 50 krad(Si)
  • Space enhanced plastic
  • Supply range: 8 V to 22 V or ±5 V to ±16.5 V
  • Integrated powered-off and overvoltage protection:
    • Overvoltage tolerance up to 85 V from source to supplies or to drain
    • Overvoltage and power-off protected up to ±60 V
    • Cold sparing capable up to ±60 V
    • Adjustable fault threshold thresholds (Vfp and Vfn) from 5 V to supplies
    • Interrupt flag feedback indicating faulted channel
    • Non-fault channels continue to operate with low leakage currents
  • Latch-up immune construction
  • Precision performance with 100 pA typical leakage current, 3.5 pF capacitance, and 1% Ron flatness
  • Operating temperature from –55°C to +125°C
  • Controlled baseline
  • Gold wire
  • NiPdAu lead finish
  • Extended product life cycle
  • Extended product-change notification
  • Product traceability
  • Enhanced mold compound for low outgassing
  • Small, industry standard TSSOP-20 packaging
  • Radiation hardened
  • Single event latch-up (SEL) immune to 43 MeV-cm2/mg at 125°C
  • ELDRS free to 30 krad(Si)
  • Total ionizing dose (TID) RLAT for every wafer lot up to 20 krad(Si)
  • TID characterized up to 50 krad(Si)
  • Space enhanced plastic
  • Supply range: 8 V to 22 V or ±5 V to ±16.5 V
  • Integrated powered-off and overvoltage protection:
    • Overvoltage tolerance up to 85 V from source to supplies or to drain
    • Overvoltage and power-off protected up to ±60 V
    • Cold sparing capable up to ±60 V
    • Adjustable fault threshold thresholds (Vfp and Vfn) from 5 V to supplies
    • Interrupt flag feedback indicating faulted channel
    • Non-fault channels continue to operate with low leakage currents
  • Latch-up immune construction
  • Precision performance with 100 pA typical leakage current, 3.5 pF capacitance, and 1% Ron flatness
  • Operating temperature from –55°C to +125°C
  • Controlled baseline
  • Gold wire
  • NiPdAu lead finish
  • Extended product life cycle
  • Extended product-change notification
  • Product traceability
  • Enhanced mold compound for low outgassing
  • Small, industry standard TSSOP-20 packaging

The TMUX582F-SEP is a modern 8:1 multiplexer suitable for both single ended and differential operation. This latch-up immune device offers robust overvoltage protection up to ±60 V making it optimal for harsh space environments. Additionally, this protection operates in powered-on, powered-off, and floating supply conditions.

During a fault such as an overvoltage or undervoltage event, the offending channel turns OFF and the Sx pin becomes high impedance. If this fault channel is selected, the drain (D) is pulled to the fault rail that is exceeded (Vfp or Vfn). All other Sx pins which are not under fault continue to operate normally. During normal operation, when the source (Sx) does not exceed Vfp or Vfn, the switch operates with low leakage, low capacitance and an ultra-flat on-resistance. This provides high performance signal integrity with minimal distortion.

The TMUX582F-SEP is a fault protected CMOS multiplexer flexible enough to handle almost any application, from system monitoring, to power-up sequencing protection, to high precision front end data acquisition.

The TMUX582F-SEP is a modern 8:1 multiplexer suitable for both single ended and differential operation. This latch-up immune device offers robust overvoltage protection up to ±60 V making it optimal for harsh space environments. Additionally, this protection operates in powered-on, powered-off, and floating supply conditions.

During a fault such as an overvoltage or undervoltage event, the offending channel turns OFF and the Sx pin becomes high impedance. If this fault channel is selected, the drain (D) is pulled to the fault rail that is exceeded (Vfp or Vfn). All other Sx pins which are not under fault continue to operate normally. During normal operation, when the source (Sx) does not exceed Vfp or Vfn, the switch operates with low leakage, low capacitance and an ultra-flat on-resistance. This provides high performance signal integrity with minimal distortion.

The TMUX582F-SEP is a fault protected CMOS multiplexer flexible enough to handle almost any application, from system monitoring, to power-up sequencing protection, to high precision front end data acquisition.

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Technische Dokumentation

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* Data sheet TMUX582F-SEP ±60-V Protected, Latch-up Immune 8:1 Multiplexer with Adjustable Fault Thresholds in Space Enhanced Plastic datasheet PDF | HTML 28 Jun 2023
* Radiation & reliability report TMUX582F-SEP Production Flow and Reliability Report 02 Jan 2024

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