SN74AUP1T32

ACTIVO

Puerta OR única positiva de baja potencia, 2 entradas, salida CMOS de 3.3 V, entrada de 1.8 V/2.5 V/

Detalles del producto

Technology family AUP1T Number of channels 1 Vout (min) (V) 2.3 Vout (max) (V) 3.6 Data rate (max) (Mbps) 200 IOH (max) (mA) -4 IOL (max) (mA) 4 Supply current (max) (µA) 0.9 Features Over-voltage tolerant inputs, Partial power down (Ioff), Single supply, Voltage translation Input type Schmitt-Trigger Output type Balanced CMOS, Push-Pull Operating temperature range (°C) -40 to 85
Technology family AUP1T Number of channels 1 Vout (min) (V) 2.3 Vout (max) (V) 3.6 Data rate (max) (Mbps) 200 IOH (max) (mA) -4 IOL (max) (mA) 4 Supply current (max) (µA) 0.9 Features Over-voltage tolerant inputs, Partial power down (Ioff), Single supply, Voltage translation Input type Schmitt-Trigger Output type Balanced CMOS, Push-Pull Operating temperature range (°C) -40 to 85
SOT-SC70 (DCK) 5 4.2 mm² 2 x 2.1
  • Single-Supply Voltage Translator
  • Output Level Up to Supply VCC CMOS Level
    • 1.8 V to 3.3 V (at VCC = 3.3 V)
    • 2.5 V to 3.3 V (at VCC = 3.3 V)
    • 1.8 V to 2.5 V (at VCC = 2.5 V)
    • 3.3 V to 2.5 V (at VCC = 2.5 V
  • Schmitt-Trigger Inputs Reject Input Noise and Provide
    Better Output Signal Integrity
  • Ioff Supports Partial Power Down (VCC = 0 V)
  • Very Low Static Power Consumption:
    0.1 µA
  • Very Low Dynamic Power Consumption:
    0.9 µA
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • Pb-Free Packages Available: SC-70 (DCK)
    2 × 2.1 × 0.65 mm (Height 1.1 mm)
  • More Gate Options Available at www.ti.com/littlelogic
  • ESD Performance Tested Per JESD 22
    • 2000-V Human-Body Model
      (A114-B, Class II)
    • 1000-V Charged-Device Model (C101)

  • Single-Supply Voltage Translator
  • Output Level Up to Supply VCC CMOS Level
    • 1.8 V to 3.3 V (at VCC = 3.3 V)
    • 2.5 V to 3.3 V (at VCC = 3.3 V)
    • 1.8 V to 2.5 V (at VCC = 2.5 V)
    • 3.3 V to 2.5 V (at VCC = 2.5 V
  • Schmitt-Trigger Inputs Reject Input Noise and Provide
    Better Output Signal Integrity
  • Ioff Supports Partial Power Down (VCC = 0 V)
  • Very Low Static Power Consumption:
    0.1 µA
  • Very Low Dynamic Power Consumption:
    0.9 µA
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • Pb-Free Packages Available: SC-70 (DCK)
    2 × 2.1 × 0.65 mm (Height 1.1 mm)
  • More Gate Options Available at www.ti.com/littlelogic
  • ESD Performance Tested Per JESD 22
    • 2000-V Human-Body Model
      (A114-B, Class II)
    • 1000-V Charged-Device Model (C101)

The SN74AUP1T32 performs the Boolean function Y = A + B or Y = A\ • B\ with designation for logic-level translation applications with output referenced to supply VCC.

AUP technology is the industry’s lowest-power logic technology designed for use in extending battery-life in operating. All input levels that accept 1.8-V LVCMOS signals, while operating from either a single 3.3-V or 2.5-V VCC supply. This product also maintains excellent signal integrity (see Figure 1 and Figure 2).

The wide VCC range of 2.3 V to 3.6 V allows the possibility of switching output level to connect to external controllers or processors.

Schmitt-trigger inputs (VT = 210 mV between positive and negative input transitions) offer improved noise immunity during switching transitions, which is especially useful on analog mixed-mode designs. Schmitt-trigger inputs reject input noise, ensure integrity of output signals, and allow for slow input signal transition.

Ioff is a feature that allows for powered-down conditions (VCC = 0 V) and is important in portable and mobile applications. When VCC = 0 V, signals in the range from 0 V to 3.6 V can be applied to the inputs and outputs of the device. No damage occurs to the device under these conditions.

The SN74AUP1T32 is designed with optimized current-drive capability of 4 mA to reduce line reflections, overshoot, and undershoot caused by high-drive outputs.

The SN74AUP1T32 performs the Boolean function Y = A + B or Y = A\ • B\ with designation for logic-level translation applications with output referenced to supply VCC.

AUP technology is the industry’s lowest-power logic technology designed for use in extending battery-life in operating. All input levels that accept 1.8-V LVCMOS signals, while operating from either a single 3.3-V or 2.5-V VCC supply. This product also maintains excellent signal integrity (see Figure 1 and Figure 2).

The wide VCC range of 2.3 V to 3.6 V allows the possibility of switching output level to connect to external controllers or processors.

Schmitt-trigger inputs (VT = 210 mV between positive and negative input transitions) offer improved noise immunity during switching transitions, which is especially useful on analog mixed-mode designs. Schmitt-trigger inputs reject input noise, ensure integrity of output signals, and allow for slow input signal transition.

Ioff is a feature that allows for powered-down conditions (VCC = 0 V) and is important in portable and mobile applications. When VCC = 0 V, signals in the range from 0 V to 3.6 V can be applied to the inputs and outputs of the device. No damage occurs to the device under these conditions.

The SN74AUP1T32 is designed with optimized current-drive capability of 4 mA to reduce line reflections, overshoot, and undershoot caused by high-drive outputs.

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Documentación técnica

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Tipo Título Fecha
* Data sheet Low Power, 1.8/2.5/3.3-V Input, 3.3-V CMOS Output, 2-Input Positive-OR Gate datasheet 16 abr 2010
Selection guide Voltage Translation Buying Guide (Rev. A) 15 abr 2021
Application brief Understanding Schmitt Triggers (Rev. A) PDF | HTML 22 may 2019

Diseño y desarrollo

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Placa de evaluación

5-8-LOGIC-EVM — Módulo de evaluación lógica genérico para encapsulados DCK, DCT, DCU, DRL y DBV de 5 a 8 pines

Módulo de evaluación (EVM) flexible diseñado para admitir cualquier dispositivo que tenga un encapsulado DCK, DCT, DCU, DRL o DBV en un recuento de 5 a 8 pines.
Guía del usuario: PDF
Paquete Pasadores Descargar
SOT-SC70 (DCK) 5 Ver opciones

Pedidos y calidad

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  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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