AFE0256
- 256 Channels
- On-Chip, 14-Bit ADC
- High Performance:
- Noise: 758 electronRMS (eRMS) with
28-pF Sensor Capacitor in 1.2-pC Range - Integral Nonlinearity: ±1.25 LSB
with Internal 14-Bit ADC - Minimum Scan Time:
- Normal Mode:
37.9 µs, Internal ADC - 2x Binning Mode: 26 µs, Internal ADC
- Normal Mode:
- Noise: 758 electronRMS (eRMS) with
- Integration:
- Eight Selectable, Full-Scale Ranges:
- 0.15 pC (min) to 9.6 pC (max)
- Built-In Correlated Double Sampler
- 2x Binning for Faster Throughput:
- Averages
Charge of Two Adjacent Channels
- Averages
- Pipelined Integration and Read:
- Allows Data Read During Integration
- Eight Selectable, Full-Scale Ranges:
- Flexibility:
- Electron and Hole Integration
- Analog Output Provided for External
High-Resolution ADC
- Low Power:
- 2.9 mW per Channel with ADC
- 2.3 mW per Channel without ADC
- 0.1 mW per Channel in Nap Mode
- Total Power-Down Feature
- 22-mm × 5-mm Gold-Bump Die Suitable for
Tape Carrier Package (TCP) or Chip-on-Film (COF)
The AFE0256 is a 256-channel analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD)-based digital x-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale charge level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four differential output drivers.
The device also features four 14-bit successive-approximation register (SAR) analog-to-digital converters (ADCs) on board. Serial data from the ADCs are available in SPI format.
Hardware-selectable integration polarity allows positive or negative charge integration and provides more flexibility in system design. The Nap feature enables substantial power saving that is especially useful in battery-powered systems.
The AFE0256 is available as a 22-mm × 5-mm singulated format with known good gold-bump dies.
技術資料
種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
---|---|---|---|---|---|---|
* | データシート | 256-Channel Analog Front-End for Flat-Panel Digital X-Ray Detector . データシート (Rev. A) | 2013年 8月 23日 |
設計および開発
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---|---|---|
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購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点