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SN74GTL16616

アクティブ

バッファ内蔵クロック出力、17 ビット、LVTTL から GTL/GTL+ への変換、ユニバーサル・バス・トランシーバ

製品詳細

Technology family GTL Applications GTL Rating Catalog Operating temperature range (°C) -40 to 85
Technology family GTL Applications GTL Rating Catalog Operating temperature range (°C) -40 to 85
SSOP (DL) 56 190.647 mm² 18.42 x 10.35
  • Member of Texas Instruments' Widebus™ Family
  • UBT™ Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, Clocked, or Clock-Enabled Modes
  • OEC™ Circuitry Improves Signal Integrity and Reduces Electromagnetic Interference
  • GTL Buffered CLKAB Signal (CLKOUT)
  • Translates Between GTL/GTL+ Signal Levels and LVTTL Logic Levels
  • Supports Mixed-Mode (3.3 V and 5 V) Signal Operation on A-Port and Control Inputs
  • Equivalent to \x9216601 Function
  • Ioff Supports Partial-Power-Down Mode Operation
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors on A Port
  • Distributed VCC and GND Pins Minimize High-Speed Switching Noise
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)

OEC, UBT, and Widebus are trademarks of Texas Instruments.

  • Member of Texas Instruments' Widebus™ Family
  • UBT™ Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, Clocked, or Clock-Enabled Modes
  • OEC™ Circuitry Improves Signal Integrity and Reduces Electromagnetic Interference
  • GTL Buffered CLKAB Signal (CLKOUT)
  • Translates Between GTL/GTL+ Signal Levels and LVTTL Logic Levels
  • Supports Mixed-Mode (3.3 V and 5 V) Signal Operation on A-Port and Control Inputs
  • Equivalent to \x9216601 Function
  • Ioff Supports Partial-Power-Down Mode Operation
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors on A Port
  • Distributed VCC and GND Pins Minimize High-Speed Switching Noise
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)

OEC, UBT, and Widebus are trademarks of Texas Instruments.

The SN74GTL16616 is a 17-bit UBT™ transceiver that provides LVTTL-to-GTL/GTL+ and GTL/GTL+-to-LVTTL signal-level translation. Combined D-type flip-flops and D-type latches allow for transparent, latched, clocked, and clocked-enabled modes of data transfer identical to the '16601 function. Additionally, this device provides for a copy of CLKAB at GTL/GTL+ signal levels (CLKOUT) and conversion of a GTL/GTL+ clock to LVTTL logic levels (CLKIN). This device provides an interface between cards operating at LVTTL logic levels and a backplane operating at GTL/GTL+ signal levels. Higher-speed operation is a direct result of the reduced output swing (<1 V), reduced input threshold levels, and OEC™ circuitry.

The user has the flexibility of using this device at either GTL (VTT = 1.2 V and VREF = 0.8 V) or the preferred higher noise margin GTL+ (VTT = 1.5 V and VREF = 1 V) signal levels. GTL+ is the Texas Instruments derivative of the Gunning Transceiver Logic (GTL) JEDEC standard JESD 8-3. The B port normally operates at GTL or GTL+ signal levels, while the A-port and control inputs are compatible with LVTTL logic levels and are 5-V tolerant. V REF is the reference input voltage for the B port. VCC (5 V) supplies the internal and GTL circuitry while VCC (3.3 V) supplies the LVTTL output buffers.

Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (CEAB\ and CEBA\) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CEAB\ is low and CLKAB is held at a high or low logic level. If LEAB is low, the A-bus data is stored in the latch/flip-flop on the low-to-high transition of CLKAB if CEAB\ also is low. When OEAB\ is low, the outputs are active. When OEAB\ is high, the outputs are in the high-impedance state. Data flow for B to A is similar to that of A to B, but uses OEBA\, LEBA, CLKBA, and CEBA\.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Active bus-hold circuitry holds unused or undriven LVTTL inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74GTL16616 is a 17-bit UBT™ transceiver that provides LVTTL-to-GTL/GTL+ and GTL/GTL+-to-LVTTL signal-level translation. Combined D-type flip-flops and D-type latches allow for transparent, latched, clocked, and clocked-enabled modes of data transfer identical to the '16601 function. Additionally, this device provides for a copy of CLKAB at GTL/GTL+ signal levels (CLKOUT) and conversion of a GTL/GTL+ clock to LVTTL logic levels (CLKIN). This device provides an interface between cards operating at LVTTL logic levels and a backplane operating at GTL/GTL+ signal levels. Higher-speed operation is a direct result of the reduced output swing (<1 V), reduced input threshold levels, and OEC™ circuitry.

The user has the flexibility of using this device at either GTL (VTT = 1.2 V and VREF = 0.8 V) or the preferred higher noise margin GTL+ (VTT = 1.5 V and VREF = 1 V) signal levels. GTL+ is the Texas Instruments derivative of the Gunning Transceiver Logic (GTL) JEDEC standard JESD 8-3. The B port normally operates at GTL or GTL+ signal levels, while the A-port and control inputs are compatible with LVTTL logic levels and are 5-V tolerant. V REF is the reference input voltage for the B port. VCC (5 V) supplies the internal and GTL circuitry while VCC (3.3 V) supplies the LVTTL output buffers.

Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (CEAB\ and CEBA\) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CEAB\ is low and CLKAB is held at a high or low logic level. If LEAB is low, the A-bus data is stored in the latch/flip-flop on the low-to-high transition of CLKAB if CEAB\ also is low. When OEAB\ is low, the outputs are active. When OEAB\ is high, the outputs are in the high-impedance state. Data flow for B to A is similar to that of A to B, but uses OEBA\, LEBA, CLKBA, and CEBA\.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Active bus-hold circuitry holds unused or undriven LVTTL inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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技術資料

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種類 タイトル 最新の英語版をダウンロード 日付
* データシート 17-Bit LVTTL-to-GTL/GTL+ Universal Bus Xceiver With Buffered Clock Outputs データシート (Rev. H) 2001年 8月 6日
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設計および開発

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シミュレーション・モデル

SN74GTL16616 IBIS Model

SCEM036.ZIP (11 KB) - IBIS Model
パッケージ ピン数 CAD シンボル、フットプリント、および 3D モデル
SSOP (DL) 56 Ultra Librarian

購入と品質

記載されている情報:
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
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  • 組み立てを実施した拠点

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