CD74ACT86-EP

Name: CD74ACT86-EP
Brand: TI
SKU: CD74ACT86-EP
Price: 1.165 USD

활성

TTL 호환 CMOS 입력을 지원하는 EP(Enhanced Product) 4채널, 2입력, 4.5V~5.5V XOR(배타적 OR) 게이트

지금 주문

데이터 시트

document-pdfAcrobat CD74ACT86-EP datasheet (영어)

CD74ACT86-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

24

Input type

TTL-Compatible CMOS

IOH (max) (mA)

-24

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

90

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

24

Input type

TTL-Compatible CMOS

IOH (max) (mA)

-24

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

90

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

SOIC (D)

14

51.9 mm² 8.65 x 6

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Inputs Are TTL-Voltage Compatible
Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption
Balanced Propagation Delays
±24-mA Output Drive Current
- Fanout to 15 F Devices
SCR-Latchup-Resistant CMOS Process and Circuit Design
Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015

⁽¹⁾Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Inputs Are TTL-Voltage Compatible
Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption
Balanced Propagation Delays
±24-mA Output Drive Current
- Fanout to 15 F Devices
SCR-Latchup-Resistant CMOS Process and Circuit Design
Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015

⁽¹⁾Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.

The CD74ACT86-EP is a quadruple 2-input exclusive-OR gate. This device performs the Boolean function Y = A B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.

The CD74ACT86-EP is a quadruple 2-input exclusive-OR gate. This device performs the Boolean function Y = A B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.

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기타 XOR(배타적 OR) 게이트 찾기

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