제품 상세 정보

Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 20 IOL (max) (mA) 64 IOH (max) (mA) -15 Input type TTL-Compatible CMOS Output type 3-State Features Bus-hold, Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family ABT Rating Catalog Operating temperature range (°C) -40 to 85
Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 20 IOL (max) (mA) 64 IOH (max) (mA) -15 Input type TTL-Compatible CMOS Output type 3-State Features Bus-hold, Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family ABT Rating Catalog Operating temperature range (°C) -40 to 85
LQFP (PM) 64 144 mm² 12 x 12
  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Members of the Texas Instruments WidebusTM Family
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • UBT TM (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors
  • B-Port Outputs of 'ABTH182504A Devices Have Equivalent 25- Series Resistors, So No External Resistors Are Required
  • State-of-the-Art EPIC-IIB TM BiCMOS Design
  • One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency
  • SCOPE TM Instruction Set
    • IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
    • Parallel-Signature Analysis at Inputs
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Device Identification
    • Even-Parity Opcodes
  • Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings

 

SCOPE, Widebus, UBT, and EPIC-IIB are trademarks of Texas Instruments Incorporated.

 

  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Members of the Texas Instruments WidebusTM Family
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • UBT TM (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors
  • B-Port Outputs of 'ABTH182504A Devices Have Equivalent 25- Series Resistors, So No External Resistors Are Required
  • State-of-the-Art EPIC-IIB TM BiCMOS Design
  • One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency
  • SCOPE TM Instruction Set
    • IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
    • Parallel-Signature Analysis at Inputs
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Device Identification
    • Even-Parity Opcodes
  • Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings

 

SCOPE, Widebus, UBT, and EPIC-IIB are trademarks of Texas Instruments Incorporated.

 

The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.

Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA, , and CLKBA inputs.

In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.

 

Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.

Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.

The B-port outputs of 'ABTH182504A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.

The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from -40°C to 85°C.

 

 

A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, CLKENBA\, and CLKBA.

Output level before the indicated steady-state input conditions were established

The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.

Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA, , and CLKBA inputs.

In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.

 

Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.

Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.

The B-port outputs of 'ABTH182504A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.

The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from -40°C to 85°C.

 

 

A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, CLKENBA\, and CLKBA.

Output level before the indicated steady-state input conditions were established

다운로드 스크립트와 함께 비디오 보기 동영상

관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 동일한 기능을 지원하는 핀 대 핀
74ACT16861 활성 3상 출력을 지원하는 20비트 버스 트랜시버 Longer propagation delay (8ns), lower average drive strength (24mA)
비교 대상 장치와 유사한 기능
SN74ACT245 활성 TTL 호환 CMOS 입력 및 3상 출력을 지원하는 옥탈 버스 트랜시버 Longer propagation delay (8ns), lower average drive strength (24mA)

기술 자료

star =TI에서 선정한 이 제품의 인기 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
22개 모두 보기
유형 직함 날짜
* Data sheet Scan Test Devices With 20-Bit Universal Bus Transceivers datasheet (Rev. C) 1996/07/01
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 2021/07/26
Application note An Overview of Bus-Hold Circuit and the Applications (Rev. B) 2018/09/17
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
EVM User's guide LASP Demo Board User's Guide 2005/11/01
Application note Programming CPLDs Via the 'LVT8986 LASP 2005/11/01
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
Application note Selecting the Right Level Translation Solution (Rev. A) 2004/06/22
Application note Quad Flatpack No-Lead Logic Packages (Rev. D) 2004/02/16
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002/08/29
Application note Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices 2002/05/10
Selection guide Advanced Bus Interface Logic Selection Guide 2001/01/09
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997/08/01
Application note Advanced BiCMOS Technology (ABT) Logic Characterization Information (Rev. B) 1997/06/01
Application note Designing With Logic (Rev. C) 1997/06/01
Application note Advanced BiCMOS Technology (ABT) Logic Enables Optimal System Design (Rev. A) 1997/03/01
Application note Family of Curves Demonstrating Output Skews for Advanced BiCMOS Devices (Rev. A) 1996/12/01
Application note Input and Output Characteristics of Digital Integrated Circuits 1996/10/01
Application note Live Insertion 1996/10/01
Application note Understanding Advanced Bus-Interface Products Design Guide 1996/05/01

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

시뮬레이션 모델

BSDL Model of SN74ABTH18504A

SCTM018.ZIP (3 KB) - BSDL Model
시뮬레이션 모델

SN74ABTH18504A IBIS Model (Rev. A)

SCBM042A.ZIP (16 KB) - IBIS Model
패키지 CAD 기호, 풋프린트 및 3D 모델
LQFP (PM) 64 Ultra Librarian

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

TI 엔지니어의 기술 지원을 받을 수 있는 TI E2E™ 포럼

콘텐츠는 TI 및 커뮤니티 기고자에 의해 "있는 그대로" 제공되며 TI의 사양으로 간주되지 않습니다. 사용 약관을 참조하십시오.

품질, 패키징, TI에서 주문하는 데 대한 질문이 있다면 TI 지원을 방문하세요. ​​​​​​​​​​​​​​

동영상