SN74ACT08-EP

Name: SN74ACT08-EP
Brand: TI
SKU: SN74ACT08-EP
Price: 1.037 USD

활성

향상된 제품, 4채널, 2입력 4.5V~5.5-V 고속(8ns) AND 게이트, TTL 호환 입력 지원

지금 주문

데이터 시트

document-pdfAcrobat SN74ACT08-EP datasheet (영어)

SN74ACT08-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

24

IOH (max) (mA)

-24

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

90

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 85

Technology family

ACT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

24

IOH (max) (mA)

-24

Input type

TTL-Compatible CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

90

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-40 to 85

SOIC (D)

14

51.9 mm² 8.65 x 6

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
4.5-V to 5.5-V V_CC Operation
Inputs Accept Voltages to 5.5 V
Max t_pd of 10 ns at 5 V
Inputs Are TTL-Voltaage Compatible

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
4.5-V to 5.5-V V_CC Operation
Inputs Accept Voltages to 5.5 V
Max t_pd of 10 ns at 5 V
Inputs Are TTL-Voltaage Compatible

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74ACT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean functions Y = A • B or Y = A\ + B\ in positive logic.

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기타 AND 게이트 찾기

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