SN74AHC00-EP

Name: SN74AHC00-EP
Brand: TI
SKU: SN74AHC00-EP
Price: 0.846 USD

활성

향상된 제품 4채널, 2입력, 2V~5.5V NAND 게이트

지금 주문

데이터 시트

document-pdfAcrobat Quadruple 2-Input Positive-NAND Gate datasheet (영어)

SN74AHC00-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

50

IOH (max) (mA)

-50

Input type

Standard CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

110

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

4

Inputs per channel

2

IOL (max) (mA)

50

IOH (max) (mA)

-50

Input type

Standard CMOS

Output type

Push-Pull

Features

Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

110

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

SOIC (D)

14

51.9 mm² 8.65 x 6

TSSOP (PW)

14

32 mm² 5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification Qualification Pedigree
EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification Qualification Pedigree
EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

The SN74AHC00 performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

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