데이터 시트
SN74HCT04-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree

- Operating Voltage Range of 4.5 V to 5.5 V
- Outputs Can Drive Up To 10 LSTTL Loads
- Low Power Consumption, 20-µA Max ICC
- Typical tpd = 13 ns
- ±4-mA Output Drive at 5 V
- Low Input Current of 1 µA Max
- Inputs Are TTL_Voltage Compatible
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
This device contains six independent inverters. It performs the Boolean function Y = A\ in a positive logic.
기술 자료
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3개 모두 보기
| 상위 문서 | 유형 | 직함 | 형식 옵션 | 최신 영어 버전 다운로드 | 날짜 |
|---|---|---|---|---|---|
| * | 데이터 시트 | SN74HCT04-EP datasheet | 2004. 1. 6 | ||
| * | 방사능 및 안정성 보고서 | SN74HCT04IDREP Reliability Report | 2013. 1. 7 | ||
| * | VID | SN74HCT04-EP VID V6204697 | 2016. 6. 21 |