전력 관리 시퀀서

TPS7H3014-SEP

활성

Radiation-tolerant, 14V four-channel power supply sequencer

제품 상세 정보

Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
Number of supplies monitored 4 Number of sequenced outputs 4 Rating Space Iq (typ) (mA) 2.5 Operating temperature range (°C) -55 to 125
TSSOP (PW) 24 49.92 mm² (7.8 mm × 6.4 mm)
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Plastic packages outgas tested per ASTM E595

  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

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기술 자료

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* 데이터 시트 TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) PDF | HTML 2025. 7. 27
* 방사능 및 안정성 보고서 TPS7H3014-SP and TPS7H3014-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) 2026. 7. 29
* 방사능 및 안정성 보고서 TPS7H3014-SEP Single-Event Effects (SEE) (Rev. A) PDF | HTML 2025. 8. 21
* 방사능 및 안정성 보고서 TPS7H3014-SEP Production Flow and Reliability Report PDF | HTML 2025. 7. 21
* 방사능 및 안정성 보고서 TPS7H3014-SEP Total Ionizing Dose (TID) 2025. 7. 16
* 방사능 및 안정성 보고서 TPS7H3014-SEP Neutron Displacement Damage (NDD) Characterization Report 2025. 7. 16
* VID TPS7H3014-SEP VID TPS7H3014-SEP VID V62-25644 2025. 10. 27
선택 가이드 TI Space Products (Rev. L) 2026. 3. 27
애플리케이션 노트 Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 2022. 9. 15
e북 Radiation Handbook for Electronics (Rev. A) 2019. 5. 21

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평가 보드

TPS7H3014EVM — TPS7H3014-SEP 평가 모듈

TPS7H3014 평가 모듈(EVM)은 단일 TPS7H3014-SEP 시퀀서의 작동을 보여줍니다. 이 보드는 데이지 체인 시퀀서와 같은 사용자 지정 구성을 테스트할 수 있는 추가 부품으로 채울 수 있는 풋프린트를 제공합니다.

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