TPS7H3014-SEP
- Radiation performance:
- Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100 krad(Si) for the QML’s and 50 krad(Si) for the SEP
- Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
- Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75 MeV-cm2/mg for the QML’s and 43 MeV-cm2/mg for the SEP
- Wide supply IN voltage range (VIN): 3V to 14V
- Sequence and monitor up to 4 voltage rails with a single device
- Daisy chain capability for extended channel count
- Single resistor programmable global timers for:
- Sequence up and down delay
- Sequence up time to regulation
- Reverse order sequence down
- Precision threshold voltage and hysteresis current
- VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
- IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
- Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
- Global ENx pull-up domain (VPULL_UP1)
- Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
- FAULT open drain output for monitoring of state machine induced faults
-
Plastic packages outgas tested per ASTM E595
- Available in military (–55°C to 125°C) temperature range
The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.
An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 日期 |
|---|---|---|---|---|
| * | Data sheet | TPS7H3014-SP and TPS7H3014-SEP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. D) | PDF | HTML | 2025年 7月 27日 |
| * | VID | TPS7H3014-SEP VID TPS7H3014-SEP VID V62-25644 | 2025年 10月 27日 | |
| * | Radiation & reliability report | TPS7H3014-SEP Single-Event Effects (SEE) (Rev. A) | PDF | HTML | 2025年 8月 21日 |
| * | Radiation & reliability report | TPS7H3014-SEP Production Flow and Reliability Report | PDF | HTML | 2025年 7月 21日 |
| * | Radiation & reliability report | TPS7H3014-SEP Neutron Displacement Damage (NDD) Characterization Report | 2025年 7月 16日 | |
| * | Radiation & reliability report | TPS7H3014-SEP Total Ionizing Dose (TID) | 2025年 7月 16日 | |
| Selection guide | TI Space Products (Rev. L) | 2026年 3月 27日 | ||
| Application note | Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) | PDF | HTML | 2022年 9月 15日 | |
| E-book | Radiation Handbook for Electronics (Rev. A) | 2019年 5月 21日 |
設計與開發
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TPS7H3014EVM — TPS7H3014-SEP 評估模組
TPS7H3014 評估模組 (EVM) 展示了單一 TPS7H3014-SEP 序列器的運作。電路板提供可裝入其他元件的元件封裝，以便進行自訂配置測試，例如菊輪鍊序列器。
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| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TSSOP (PW) | 24 | Ultra Librarian |
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