SGLS307P July 2006 – February 2018 TLK2711-SP
PRODUCTION DATA.
The transceiver can provide a self-test function by enabling (LOOPEN) the internal loopback path. Enabling this pin causes serial-transmitted data to be routed internally to the receiver. The parallel data output can be compared to the parallel input data for functional verification. The external differential output is held in a high-impedance state during the loopback testing.