SBASB61 August   2026 ADS114S18 , ADS124S18

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Noise Performance
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Analog Inputs and Multiplexer
      2. 7.3.2  Programmable Gain Amplifier (PGA)
      3. 7.3.3  Voltage Reference
        1. 7.3.3.1 Internal Reference
        2. 7.3.3.2 External Reference
        3. 7.3.3.3 Reference Buffers
      4. 7.3.4  Power-Scalable Speed Modes
      5. 7.3.5  Clock Source
      6. 7.3.6  Delta-Sigma Modulator
      7. 7.3.7  Digital Filter
        1. 7.3.7.1 Sinc3 and Sinc4 Filters
        2. 7.3.7.2 Sinc4 + Sinc1 Filter
        3. 7.3.7.3 FIR Filter
        4. 7.3.7.4 50Hz and 60Hz Line Cycle Rejection
        5. 7.3.7.5 Digital Filter Latency
        6. 7.3.7.6 Global-Chop Mode
      8. 7.3.8  Excitation Current Sources (IDACs)
      9. 7.3.9  Burn-Out Current Sources (BOCS)
      10. 7.3.10 Bias Voltage Generator (VBIAS)
      11. 7.3.11 General Purpose IOs (GPIOs)
        1. 7.3.11.1 ALERT Output
        2. 7.3.11.2 FAULT Output
      12. 7.3.12 Offset and Gain Calibration Coefficients
      13. 7.3.13 Digital Comparator
      14. 7.3.14 System Monitors
        1. 7.3.14.1 Internal Short (Offset Calibration)
        2. 7.3.14.2 Internal Temperature Sensor
        3. 7.3.14.3 External Reference Voltage Readback
        4. 7.3.14.4 Power-Supply Readback
      15. 7.3.15 Monitors and Status Flags
        1. 7.3.15.1 Reset (RESETn flag)
        2. 7.3.15.2 AVDD Undervoltage Monitor (AVDD_UVn flag)
        3. 7.3.15.3 Reference Undervoltage Monitor (REF_UVn flag)
        4. 7.3.15.4 SPI CRC Fault (SPI_CRC_FAULTn flag)
        5. 7.3.15.5 Register Map CRC Fault (REG_MAP_CRC_FAULTn flag)
        6. 7.3.15.6 Internal Memory Fault (MEM_FAULTn flag)
        7. 7.3.15.7 Register Write Fault (REG_WRITE_FAULTn flag)
        8. 7.3.15.8 Digital Comparator Alert (COMP_ALERTn flag)
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-up and Reset
        1. 7.4.1.1 Power-On Reset (POR)
        2. 7.4.1.2 RESET Pin
        3. 7.4.1.3 Reset by Register Write
        4. 7.4.1.4 Reset by SPI Input Pattern
      2. 7.4.2 Operating Modes
        1. 7.4.2.1 Idle and Standby Mode
        2. 7.4.2.2 Power-Down Mode
        3. 7.4.2.3 Sequencer Mode
          1. 7.4.2.3.1 Configuring the Sequencer
          2. 7.4.2.3.2 Starting and Stopping the Sequencer (START/STOP bits and START pin)
          3. 7.4.2.3.3 Sequencer Status Bits
    5. 7.5 Programming
      1. 7.5.1  Serial Interface (SPI)
      2. 7.5.2  Serial Interface Signals
        1. 7.5.2.1 Chip Select (CS)
        2. 7.5.2.2 Serial Clock (SCLK)
        3. 7.5.2.3 Serial Data Input (SDI)
        4. 7.5.2.4 Serial Data Output/Data Ready (SDO/DRDY)
        5. 7.5.2.5 Data Ready (DRDY) Pin
      3. 7.5.3  Serial Interface Communication Structure
        1. 7.5.3.1 SPI Frame
        2. 7.5.3.2 STATUS Header
        3. 7.5.3.3 SPI CRC
      4. 7.5.4  Device Commands
        1. 7.5.4.1 No Operation (Read Conversion Data)
        2. 7.5.4.2 Read Register Command
        3. 7.5.4.3 Write Register Command
      5. 7.5.5  Continuous-Read Mode
        1. 7.5.5.1 Read Registers in Continuous-Read Mode
      6. 7.5.6  Daisy-Chain Operation
      7. 7.5.7  3-Wire SPI Mode
        1. 7.5.7.1 3-Wire SPI Mode Frame Re-Alignment
      8. 7.5.8  Monitoring for New Conversion Data
        1. 7.5.8.1 DRDY Pin or SDO/DRDY Pin Monitoring
        2. 7.5.8.2 Reading DRDY Bit and Conversion Counter
        3. 7.5.8.3 Clock Counting
      9. 7.5.9  DRDY Pin Behavior
      10. 7.5.10 Register Map CRC
      11. 7.5.11 Conversion Data Format
  9. 8 Register Map
    1. 8.1 Status and General Configuration Page Registers
    2. 8.2 Step Configuration Page Registers
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Serial Interface Connections
      2. 9.1.2 Unused Inputs and Outputs
      3. 9.1.3 Interfacing With Multiple Devices
      4. 9.1.4 Device Initialization and Starting the Sequencer
      5. 9.1.5 Sequencer Configuration Strategy Example
    2. 9.2 Typical Applications
      1. 9.2.1 Software-Configurable RTD Measurement Input
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Performance Plots
        4. 9.2.1.4 Design Variant – 3-Wire RTD Measurement With Automatic Lead-Wire Compensation Using Two IDACs
      2. 9.2.2 Thermocouple Measurement With Cold-Junction Compensation Using a 2-wire RTD
      3. 9.2.3 Resistive Bridge Sensor Measurement With Temperature Compensation
      4. 9.2.4 Autonomous Power Supply Monitoring
        1. 9.2.4.1 Design Requirements
        2. 9.2.4.2 Detailed Design Procedure
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 Power Supplies
      2. 9.3.2 Power-Supply Sequencing
      3. 9.3.3 Power-Supply Decoupling
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

7.1 Overview

The ADS1x4S1x are low-power, 16- and 24-bit, ΔΣ ADCs that offer many integrated features to reduce system cost and component count in the most common sensor measurement applications. The devices are available in a 7mm × 7mm TQFP-32 package.

Key integrated analog features include:

  • A flexible input multiplexer which allows to select any of the 8 (ADS1x4S14) or 18 (ADS1x4S18) analog inputs, or AVSS as positive or negative input.
  • A low-noise, high input-impedance PGA with programmable gain from 0.5 to 256.
    • Gain of 0.5 allows to measure signals which are larger than the selected reference voltage.
    • Single-ended measurements, where the negative input is connected to AVSS, are possible for gain settings between 0.5 and 10.
  • A low-drift voltage reference programmable to 1.25V or 2.5V. A buffered version of the internal voltage reference is available on the REFOUT pin which can be used to bias external circuitry.
  • Two external, differential reference input pairs (REFP0, REFN0 and REFP1, REFN1) with optional reference buffers that can be individually enabled and disabled.
  • Two matched, sensor-excitation current sources (IDACs) which can be routed to any of the 8 (ADS1x4S14) or 18 (ADS1x4S18) analog inputs to bias resistive sensors, such as thermistors, resistance temperature detectors (RTDs), or bridge sensors. Excitation currents between 1μA and 1mA can be programmed with fine granularity.
  • A set of programmable burn-out current sources that are used for sensor fault detection.
  • A low-drift 4.096MHz oscillator which establishes the device main clock. Alternatively an external clock can be provided.
  • A linear temperature sensor.
  • A bias voltage generator (VBIAS) that is used to bias floating sensors, such as thermocouples.
  • Analog supply and reference undervoltage monitors. Depending on the circuit implementation, the reference undervoltage monitor is especially helpful to detect open sensor conditions.
  • Eight general-purpose input/output pins (GPIOs) which are shared with analog inputs on the ADS1x4S18. Push-pull or open-drain output configurations can be individually selected for each general-purpose output. The GPIOs use logic levels based on the analog supply.

The devices also include a variety of digital features to accommodate a wide range of applications:

  • Four speed modes allow to optimize the power consumption and noise performance for each application.
  • Depending on the selected speed mode, output data rates from 3.9SPS up to 128kSPS can be achieved by adjusting the oversampling ratio (OSR) of the integrated digital filter. At output data rates of 20SPS and 25SPS, the digital filter offers simultaneous 50Hz and 60Hz line-cycle rejection with single-cycle settling.
  • A sequencer allows to scan through up to 24 individually programmable sequence step configurations without host controller interaction.
  • A global-chop mode which reduces offset and offset drift to a minimum.
  • User offset and gain calibration registers per sequence step.
  • A digital comparator with configurable high and low thresholds per sequence step. Together with the sequencer, the digital comparator can for example be used for autonomous supply voltage monitoring. Use the dedicated digital comparator ALERT output pin to interrupt and notify the host controller of a tripped comparator.
  • An SPI-compatible serial interface to read conversion and register data, as well as to configure and control the device. 3-wire SPI operation is possible when the CS pin is tied low permanently to reduce the number of required digital communication signals. The interface allows communication with multiple devices on one SPI bus in a daisy chain.
  • Data integrity features, such as SPI CRC, register map CRC, and internal memory CRC to detect communication faults and unintended bit flips.
  • Selection between two output data coding schemes: binary two's complement and unipolar straight binary format. The unipolar straight binary format is beneficial for applications where the differential input signal is always positive.