SLVUBG5A June   2018  – September 2021 ESD122 , ESD204 , ESD401 , SN65220 , SN65240 , TPD1E01B04 , TPD1E04U04 , TPD1E05U06 , TPD1E10B06 , TPD1E10B06-Q1 , TPD1E10B09 , TPD1E10B09-Q1 , TPD2E001 , TPD2E001-Q1 , TPD2E009 , TPD2E1B06 , TPD2E2U06-Q1 , TPD2EUSB30 , TPD2S017 , TPD4E001-Q1 , TPD4E004 , TPD4E02B04 , TPD4E05U06 , TPD4E05U06-Q1 , TPD4E101 , TPD4E1B06 , TPD4E1U06 , TPD4E6B06 , TPD5E003 , TPD6E001 , TPD6E004 , TPD6E05U06 , TPD8E003 , TPD8S009 , TVS2200 , UC1611-SP , UC2610 , UC3610 , UC3611 , UC3611M

 

  1.   Trademarks
  2. 1Introduction
  3. 2Definitions
  4. 3S-Parameter Analysis
    1. 3.1 DQA 4-Port Analysis
  5. 4Lower Speed Device Testing
    1. 4.1 ESD Tests
      1. 4.1.1 Test Method and Set-Up
      2. 4.1.2 Evaluation of Test Results
  6. 5Board Layout
  7. 6Schematics and Bill of Materials
    1. 6.1 Schematics
    2. 6.2 Bill of Materials
  8. 7Revision History

1 Introduction

Texas Instrument's ESDEVM evaluation module allows the evaluation of most of TI's ESD portfolio. The board comes with all traditional ESD footprints in order to be able to test any number of devices. Devices that need to be tested can be soldered onto their respect footprint and then tested. For the typical high speed ESD devices, an impedance controlled layout is implemented to be able to take the S-parameter and de-embed the board trace. For the non-high speed ESD diodes, footprints with traces going to test points are provided to easily run DC tests such as breakdown voltage, holding voltage, leakage, and so forth. The board layout also makes it easy to connect any of the device's pins to either power (VCC) or ground by shorting the signal pin to which every the signal is. This board allows the testing of all of these typical ESD diode footprints:

  • DPY (0402)
  • DPL (0201)
  • DQA
  • DBV
  • DCK
  • DPK
  • DRY
  • DRB

  • DYA (SOD-523)

  • DQD
  • RVZ
  • DPW

More information about TI's packages