The INA237-Q1 is an ultra-precise digital power monitor with a 16-bit
delta-sigma ADC specifically designed for current-sensing applications. The device
can measure a full-scale differential input of ±163.84mV or ±40.96mV across a
resistive shunt sense element with common-mode voltage support from –0.3V to
+85V.
The INA237-Q1 reports current, bus voltage, temperature, and power, all
while performing the needed calculations in the background. The integrated
temperature sensor is ±1°C accurate for die temperature measurement and is useful in
monitoring the system ambient temperature.
The low offset and gain drift design of the INA237-Q1 allows the device
to be used in precise systems that do not undergo multi-temperature calibration
during manufacturing. Further, the very low offset voltage and noise allow for use
in A to kA sensing applications and provide a wide dynamic range without significant
power dissipation losses on the sensing shunt element. The low input bias current of
the device permits the use of larger current-sense resistors, thus providing
accurate current measurements in the micro-amp range.
The device allows for selectable ADC
conversion times from 50µs to 4.12ms as well as sample averaging from 1x to 1024x,
which further helps reduce the noise of the measured data.
The INA237-Q1 is an ultra-precise digital power monitor with a 16-bit
delta-sigma ADC specifically designed for current-sensing applications. The device
can measure a full-scale differential input of ±163.84mV or ±40.96mV across a
resistive shunt sense element with common-mode voltage support from –0.3V to
+85V.
The INA237-Q1 reports current, bus voltage, temperature, and power, all
while performing the needed calculations in the background. The integrated
temperature sensor is ±1°C accurate for die temperature measurement and is useful in
monitoring the system ambient temperature.
The low offset and gain drift design of the INA237-Q1 allows the device
to be used in precise systems that do not undergo multi-temperature calibration
during manufacturing. Further, the very low offset voltage and noise allow for use
in A to kA sensing applications and provide a wide dynamic range without significant
power dissipation losses on the sensing shunt element. The low input bias current of
the device permits the use of larger current-sense resistors, thus providing
accurate current measurements in the micro-amp range.
The device allows for selectable ADC
conversion times from 50µs to 4.12ms as well as sample averaging from 1x to 1024x,
which further helps reduce the noise of the measured data.