VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

The SN54SC1G08-SEP device is a single 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = Ā + B̅ in positive logic.

다운로드 스크립트와 함께 비디오 보기 비디오

star

=TI에서 선정한 이 제품의 인기 문서

검색된 결과가 없습니다. 검색어를 지우고 다시 시도하세요.

5개 모두 보기

상위 문서	유형	직함	형식 옵션	날짜
*	Data sheet	SN54SC1G08-SEP Radiation Tolerant Single 2-Input Positive-AND Gate datasheet	PDF \| HTML	2026/05/04
*	Radiation & reliability report	SN54SC1G08-SEP Total Ionizing Dose (TID) Report		2026/04/30
*	Radiation & reliability report	SN54SC1G125-SEP Total Ionizing Dose (TID)		2026/04/30
*	Radiation & reliability report	SN54SC1G08-SEP Production Flow and Reliability Report	PDF \| HTML	2026/04/01
*	Radiation & reliability report	SN54SC1G08-SEP Single-Event Effects (SEE) Radiation Report	PDF \| HTML	2025/04/30

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

5~8핀 수의 DCK, DCT, DCU, DRL 또는 DBV 패키지가 있는 모든 디바이스를 지원하도록 설계된 유연한 EVM.

사용 설명서: PDF

TI.com에서 구매할 수 없음

패키지	핀	CAD 기호, 풋프린트 및 3D 모델
SOT-23 (DBV)	5	Ultra Librarian

포함된 정보:

포함된 정보:

콘텐츠는 TI 및 커뮤니티 기고자에 의해 "있는 그대로" 제공되며 TI의 사양으로 간주되지 않습니다. 사용 약관을 참조하십시오.

품질, 패키징, TI에서 주문하는 데 대한 질문이 있다면 TI 지원을 방문하세요.

SN54SC1G08-SEP

방사능 내성 1채널, 2입력 AND 게이트