SN74AHC244-EP

Name: SN74AHC244-EP
Brand: TI
SKU: SN74AHC244-EP
Price: 1.164 USD

활성

3상 출력을 지원하는 향상된 제품 8채널, 2V~5.5V 버퍼

지금 주문

데이터 시트

document-pdfAcrobat SN74AHC244-EP datasheet (Rev. A) (영어)

SN74AHC244-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

50

Supply current (max) (µA)

40

IOH (max) (mA)

-50

Input type

Standard CMOS

Output type

3-State

Features

Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

8

IOL (max) (mA)

50

Supply current (max) (µA)

40

IOH (max) (mA)

-50

Input type

Standard CMOS

Output type

3-State

Features

Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

SOIC (DW)

20

131.84 mm² 12.8 x 10.3

TSSOP (PW)

20

41.6 mm² 6.5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
EPIC™ (Enhanced-Performance Implanted CMOS) Process
Operating Range 2-V to 5.5-V V_CC
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

EPIC is a trademark of Texas Instruments.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
EPIC™ (Enhanced-Performance Implanted CMOS) Process
Operating Range 2-V to 5.5-V V_CC
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

EPIC is a trademark of Texas Instruments.

This octal buffer/driver is designed specifically to improve the performance and density of 3-state memory-address drivers, clock drivers, and bus-oriented receivers and transmitters.

The SN74AHC244 is organized as two 4-bit buffers/line drivers with separate output-enable (OE)\ inputs. When OE\ is low, the device passes data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This octal buffer/driver is designed specifically to improve the performance and density of 3-state memory-address drivers, clock drivers, and bus-oriented receivers and transmitters.

The SN74AHC244 is organized as two 4-bit buffers/line drivers with separate output-enable (OE)\ inputs. When OE\ is low, the device passes data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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