LMG3526R030
- 650-V GaN-on-Si FET with integrated gate driver
- Integrated high precision gate bias voltage
- 200-V/ns FET hold-off
- 2-MHz switching frequency
- 20-V/ns to 150-V/ns slew rate for optimization of switching performance and EMI mitigation
- Operates from 7.5-V to 18-V supply
- Robust protection
- Cycle-by-cycle overcurrent and latched short-circuit protection with < 100-ns response
- Withstands 720-V surge while hard-switching
- Self-protection from internal overtemperature and UVLO monitoring
- Advanced power management
- Digital temperature PWM output
- Top-side cooled 12-mm × 12-mm VQFN package separates electrical and thermal paths for lowest power loop inductance
- Zero-voltage detection feature that facilitates soft-switching converters
The LMG3526R030 GaN FET with integrated driver and protections is targeting switch-mode power converters and enables designers to achieve new levels of power density and efficiency.
The LMG3526R030 integrates a silicon driver that enables switching speed up to 150 V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TIs low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20 V/ns to 150 V/ns, which can be used to actively control EMI and optimize switching performance.
Advanced features include digital temperature reporting, fault detection, and zero-voltage detection (ZVD). The temperature of the GaN FET is reported through a variable duty cycle PWM output. Faults reported include overtemperature, overcurrent, and UVLO monitoring. ZVD feature can provide a pulse output from ZVD pin when zero-voltage switching (ZVS) is realized.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | LMG3526R030 650-V 30-mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting datasheet (Rev. A) | PDF | HTML | 2023年 4月 27日 |
Technical article | GaN 開關整合如何在 PFC 中實現低 THD 與高效率 | PDF | HTML | 2024年 3月 21日 | |
White paper | Achieving GaN Products With Lifetime Reliability | PDF | HTML | 2021年 6月 2日 | |
Application note | Thermal Design and Performance of Top-Side Cooled QFN 12x12 Package | 2021年 3月 5日 |
設計與開發
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封裝 | 引腳 | 下載 |
---|---|---|
VQFN (RQS) | 52 | 檢視選項 |
訂購與品質
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- 資格摘要
- 進行中可靠性監測
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