VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

VID V62/26601
Radiation - total ionizing dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - single-event effects (SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range from 1.2V to 5.5V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 100mA per JESD 78
Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

The SN54SC1G08-SEP device is a single 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = Ā + B̅ in positive logic.

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重要文件	類型	標題	格式選項	日期
*	Data sheet	SN54SC1G08-SEP Radiation Tolerant Single 2-Input Positive-AND Gate datasheet	PDF \| HTML	2026年 5月 4日
*	Radiation & reliability report	SN54SC1G08-SEP Total Ionizing Dose (TID) Report		2026年 4月 30日
*	Radiation & reliability report	SN54SC1G125-SEP Total Ionizing Dose (TID)		2026年 4月 30日
*	Radiation & reliability report	SN54SC1G08-SEP Production Flow and Reliability Report	PDF \| HTML	2026年 4月 1日
*	Radiation & reliability report	SN54SC1G08-SEP Single-Event Effects (SEE) Radiation Report	PDF \| HTML	2025年 4月 30日

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