SBASAL2 November 2025 ADC32RF72
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
|---|---|---|---|---|---|---|
| ADC Timing Specifications | ||||||
| TAD | Aperture Delay | 0.15 | ns | |||
| Aperture Delay variation | 0.05 | ns | ||||
| TA | Aperture Jitter | 40 | fs | |||
| CER | Code error rate | 1e-15 | errors/sample | |||
| Wake up time | time to valid data (SNR within 2dB of data sheet values) after coming out of fast power down (JESD stays active) | 5 | μs | |||
| LATENCY: tPD + tADC | ||||||
| tPD | Propagation delay | 1 | ns | |||
| tADC | ADC latency from sampling instant to JESD output | DDC bypass, LMFS = 8411 | 524 | ADC clock cycles | ||
| SERIAL PROGRAMMING INTERFACE (SCLK, SEN, SDIO) - Input | ||||||
| fCLK(SCLK) | Serial clock frequency | 1 | 50 | MHz | ||
| tS(SEN) | SEN to rising edge of SCLK | 10 | ns | |||
| tH(SEN) | SEN from rising edge of SCLK | 10 | ns | |||
| tSU(SDIO) | SDIO to rising edge of SCLK | 10 | ns | |||
| tH(SDIO) | SDIO from rising edge of SCLK | 10 | ns | |||
| SERIAL PROGRAMMING INTERFACE (SDIO, SDOUT) - Output | ||||||
| t(OZD) | SDIO tri-state to driven | 10 | ns | |||
| t(ODZ) | SDIO data to tri-state | 14 | ns | |||
| t(OD) | SDIO valid from falling edge of SCLK | 10 | ns | |||
| Timing: SYSREFP/N | ||||||
| ts(SYSREF) | Setup time, SYSREFP/N valid to rising edge of CLKP/N | 50 | ps | |||
| th(SYSREF) | Hold time, SYSREFP/N valid to rising edge of CLKP/N | 50 | ps | |||
| CML SerDes Outputs: STX[0..7]P/N | ||||||
| fSerdes | SerDes bit rate | 4.0 | 24.75 | Gbps | ||
| RJ | Random jitter | 0.45 | ps | |||
| DJ | Deterministic jitter | 12.5 | ps | |||
| TJ | Total jitter, peak-peak | 19.7 | ps | |||