SLUAAY0 September   2025 UCC57102 , UCC57102-Q1 , UCC57102Z , UCC57102Z-Q1 , UCC57108 , UCC57108-Q1 , UCC57132 , UCC57132-Q1 , UCC57138 , UCC57138-Q1 , UCC57142 , UCC57142-Q1 , UCC57148 , UCC57148-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2TI Non-Isolated SiC MOSFET Gate Drivers Overview
  6. 3SiC MOSFET Gate Driver Design Considerations
    1. 3.1 Undervoltage Lockout (UVLO)
    2. 3.2 Negative Bias Supply (Bipolar Drive)
    3. 3.3 Short-Circuit Protection
      1. 3.3.1 Desaturation Protection
      2. 3.3.2 Overcurrent Protection
      3. 3.3.3 Soft Turn-Off
  7. 4PFC CCM Boost Low-Side Gate Driver Example
    1. 4.1 Gate Driver Requirements
    2. 4.2 Gate Driver Selection
    3. 4.3 Gate Driver Power Dissipation
  8. 5Summary
  9. 6References

3.3 Short-Circuit Protection

High-power applications carry a large risk of short-circuit events, which can severely damage the SiC MOSFET and other components in the system. Different short-circuit protection methods can be implemented with fast detection and limited false trigger to mitigate damage from short-circuit events.