SLUSFB5A June 2024 – April 2025 BQ41Z50
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| VCC_IN(2) | Input voltage range for measurements | VSRP – VSRN | –0.2 | 0.2 | V | |
| BCC_INL(1)(2) | Integral nonlinearity | 16-bit, best fit over input voltage range | ±5.2 | ±22.3 | LSB | |
| BCC_DNL(2) | Differential nonlinearity | 16-bit, no missing codes | –1 | 1 | LSB | |
| VCC_OFF | Offset error | 16-bit, uncalibrated | –2 | 2 | LSB | |
| VCC_OFF_DRIFT | Offset error drift | 16-bit, post-calibration | –0.035 | 0.035 | LSB/°C | |
| BCC_GAIN | Gain | 16-bit, over ideal input voltage range. Measured and stored in Flash. |
267200 | LSB/V | ||
| RCC_IN | Effective input resistance | When converting | 2 | MΩ | ||
| ILKG | SRP and SRN Input leakage | When Coulomb counter not running | 0.5 | µA | ||