SPRACM9B June   2019  – November 2020 TMS320F28384D , TMS320F28384S , TMS320F28386D , TMS320F28386S , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DK-Q1

 

  1.   Trademarks
  2. Introduction
    1. 1.1 Acronyms Used in This Document
  3. Benefits of the TMS320F2838x MCU for High-Bandwidth Current Loop
  4. Current Loops in Servo Drives
  5. Outline of the Fast Current Loop Library
  6. Fast Current Loop Evaluation
    1. 5.1 Evaluation Setup
      1. 5.1.1 Hardware
      2. 5.1.2 Software
      3. 5.1.3 FCL With T-Format Type Position Encoder
        1. 5.1.3.1 Connecting T-Format Encoder to IDDK
        2. 5.1.3.2 T-Format Interface Software
        3. 5.1.3.3 T-Format Encoder Latency Considerations
      4. 5.1.4 SDFM
      5. 5.1.5 Incremental System Build
  7. Incremental Build Level 1
    1. 6.1 SVGEN Test
    2. 6.2 Testing SVGEN With DACs
    3. 6.3 Inverter Functionality Verification
  8. Incremental Build Level 2
    1. 7.1 Setting the Overcurrent Limit in the Software
    2. 7.2 Current Sense Method
    3. 7.3 Voltage Sense Method
    4. 7.4 Setting Current Regulator Limits
    5. 7.5 Verification of Current Sense
    6. 7.6 Position Encoder Feedback
      1. 7.6.1 Speed Observer and Position Estimator
      2. 7.6.2 Verification of Position Encoder Orientation
  9. Incremental Build Level 3
    1. 8.1 Observation One – PWM Update Latency
      1. 8.1.1 From the Expressions Window
      2. 8.1.2 From the Scope Plot
  10. Incremental Build Level 4
    1. 9.1 Observation
  11. 10Incremental Build Level 5
  12. 11Incremental Build Level 6
    1. 11.1 Integrating SFRA Library
    2. 11.2 Initial Setup Before Starting SFRA
    3. 11.3 SFRA GUIs
    4. 11.4 Setting Up the GUIs to Connect to Target Platform
    5. 11.5 Running the SFRA GUIs
    6. 11.6 Influence of Current Feedback SNR
    7. 11.7 Inferences
      1. 11.7.1 Bandwidth Determination From Closed Loop Plot
      2. 11.7.2 Phase Margin Determination From Open Loop Plot
      3. 11.7.3 Maximum Modulation Index Determination From PWM Update Time
      4. 11.7.4 Voltage Decoupling in Current Loop
    8. 11.8 Phase Margin vs Gain Crossover Frequency
  13. 12Incremental Build Level 7
    1. 12.1 Run the Code on CPU1 to Allocate ECAT to CM
    2. 12.2 Run the Code on CM to Setup ECAT
    3. 12.3 Setup TwinCAT
    4. 12.4 Scanning for EtherCAT Devices via TwinCAT
    5. 12.5 Program ControlCard EEPROM for ESC
    6. 12.6 Running the Application
  14. 13Incremental Build Level 8
    1. 13.1 Run the Code on CPU1 to Allocate ECAT to CM
    2. 13.2 Run the Code on CM to Setup ECAT
    3. 13.3 Running the Application
  15. 14References
  16. 15Revision History

From the Expressions Window

While running the motor in this build level and subsequent build levels, observe the variable fclLatencyInMicroSec in the Expressions window.

Figure 8-2 shows a snapshot of the Expressions window.

GUID-ABC3637D-7B87-4F39-9B1E-806585CE0121-low.jpgFigure 8-2 Expressions Window Snapshot For Latency

This variable indicates the amount of time elapsed between the feedback sampling and PWM updating. The elapsed time, or latency, is computed based on the count of the EPWM timer right after the PWM update. The value shown here is more than the actual update time by a few clock cycles. Immediately after setting the runMotor flag to MOTOR_RUN and the motor begins to run, the latency time shows up as nearly 1.25 µs due to initial setup in the code. This amount of latency occurs at a time when the duty cycle is moderate and is therefore acceptable. After this period, you can refresh the latency time by setting fclClrCntr to 1. Regardless of SAMPLING_METHOD, latency remains the same for a given FCL_CNTLR. When FCL_CNTLR is a PI_CNTLR, the latency is about 0.96 µs compared to 0.98 µs with a CMPLX_CNTLR (see the following note).

Note:
  • These times can be reduced further by around 0.1 µs range using code inline and other optimization techniques. Because the evaluation code is in library format, it has certain overheads.
  • The sampling window for ADC is kept wide enough to ensure a cleaner signal acquisition. Depending on board layout and circuits feeding in to ADC channels, it may be possible to reduce this time window by nearly 60%.