SWRS318A November 2024 – June 2025 AWR2944P
PRODUCTION DATA
Boundary scan database of testable input and output pins for IEEE 1149.1 of the specific device can be obtained by contacting a TI representative.
IBIS model IO buffer information model for the IO buffers of the device can be obtained by contacting a TI representative. For simulation on a circuit board, see IBIS Open Forum.