TLE4275-Q1
- AEC-Q100 qualified for automotive applications:
- Temperature grade 1: –40°C to +125°C, TA
- Junction temperature: –40°C to +150°C, TJ
- Input voltage range:
- Legacy chip: 5.5V to 42V (45V absolute max)
- New chip: 3.0V to 40V (42V absolute max)
- Maximum output current:
- Legacy chip: 450mA
- New chip: 500mA
- Output voltage accuracy: ±2.0% (across line, load and temperature)
- Low dropout voltage: 500mV (max) at 300mA
- Low quiescent current:
- Legacy chip: 100µA (typ) at IOUT = 1mA
- New chip: 28µA (typ) at IOUT = 1mA
- Excellent line transient response (new chip):
- ±2% VOUT deviation during cold-crank
- ±2% VOUT deviation (1V/µs VIN slew rate)
- Power-good (reset) with programmable delay period
- Stable with a 2.2µF or larger capacitor (new chip)
- Reverse-polarity protection (legacy chip)
- Overcurrent and overtemperature protection
- Packages:
- 5-pin TO-252 (KVU)
- 5-pin DDPAK/TO-263 (KTT)
- 20-pin HTSSOP (PWP) (legacy chip)
The TLE4275-Q1 is a low-dropout linear regulator designed to connect to the battery in automotive applications. For the new chip, the device has an input voltage range extending to 40V that drives loads up to 500mA. This range allows the device to withstand transients (such as load dumps) that are anticipated in automotive systems. With only a 28µA quiescent current at IOUT = 1mA (new chip), the device is designed for powering always-on components. Microcontrollers (MCUs) and controller area network (CAN) transceivers in standby systems are examples of such components.
The new chip version of the device has state-of-the-art transient response that allows the output to quickly react to changes in load or line (for example, during cold-crank conditions). Additionally, the new chip version has a novel architecture that minimizes output overshoot when recovering from dropout. During normal operation, the device has a tight DC accuracy of ±2.0% over line, load, and temperature (new chip).
The power-good (reset) delay is adjusted by an external capacitor on the delay pin, allowing the delay time to be configured to fit application-specific systems.
The device also incorporates a number of internal circuits for protection against overload and overtemperature. The legacy chip also provides protection against reverse polarity. The legacy chip requires COUT ≥ 22µF with max supported ESR range of ≤ 5Ω and new chip requires COUT ≥ 2.2µF with max supported ESR range of ≤ 2Ω, within the operating temperature range.
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技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | TLE4275-Q1 Automotive, 500mA, 40V, Low-Dropout Regulator With Power-Good datasheet (Rev. J) | PDF | HTML | 2025年 5月 23日 |
| Application note | LDO Noise Demystified (Rev. B) | PDF | HTML | 2020年 8月 18日 | |
| Application note | LDO PSRR Measurement Simplified (Rev. A) | PDF | HTML | 2017年 8月 9日 | |
| Technical article | Discrete SBCs: versatile and scalable solutions for any application | PDF | HTML | 2017年 7月 27日 | |
| More literature | Fundamentals of designing with LDOs in auto battery direct connect applications | 2017年 2月 27日 | ||
| Application note | TLE4275 Low Temperature Stability | 2012年 1月 18日 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
MLTLDO2EVM-037 — 適用於 DCY、DDA 和 KVU 封裝的通用 LDO 線性電壓穩壓器評估模組
MLTLDO2EVM-037 多重封裝低壓差 (LDO) 評估模組 (EVM) 可讓設計工程師評估多種常用線性穩壓器封裝的運作情形及性能，以利在自己的電路應用中使用。此 EVM 配置包含 DDA、3 針腳和 5 針腳 KVU，以及用於工程師焊接和評估其零件的 DCY 封裝板上配置。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| HTSSOP (PWP) | 20 | Ultra Librarian |
| TO-252 (KVU) | 5 | Ultra Librarian |
| TO-263 (KTT) | 5 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。