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線性與低壓差 (LDO) 穩壓器

TPS7H1121-SP

現行

Radiation-hardened QMLV, 2.25V to 14V input, 2A low-dropout (LDO) regulator

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產品規格表

TPS7H1121-SP

現行
產品規格表 立即訂購

產品詳細資料

Rating Space Vin (max) (V) 14 Vin (min) (V) 2.25 Iout (max) (A) 2 Output options Adjustable Output Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Features Adjustable current limit, Enable, Power good, Soft start Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
Rating Space Vin (max) (V) 14 Vin (min) (V) 2.25 Iout (max) (A) 2 Output options Adjustable Output Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Features Adjustable current limit, Enable, Power good, Soft start Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range
  • Total Ionizing Dose radiation characterized:

    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. The device is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. The device is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.
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重要文件 類型 標題 格式選項 日期
* Data sheet TPS7H1121-SP and TPS7H1121-SEP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator datasheet (Rev. C) PDF | HTML 2025年 11月 3日
* Radiation & reliability report TPS7H1121-SP Total Ionizing Dose (TID) Radiation Report (Rev. A) 2026年 2月 13日
* SMD TPS7H1121-SP SMD 5962-23203 2024年 12月 16日
* Radiation & reliability report TPS7H1121-SP Neutron Displacement Damage (NDD) Characterization Report PDF | HTML 2024年 9月 19日
* Radiation & reliability report TPS7H1121-SP Single-Event Effects (SEE) PDF | HTML 2024年 9月 18日
Application note Highly Scalable Space Motor Control Platform based on TI’s Space Enhanced Products (-SEP) and Space Products PDF | HTML 2026年 6月 8日
Selection guide TI Space Products (Rev. L) 2026年 3月 27日
Application note Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form (Rev. A) PDF | HTML 2025年 11月 5日
Application brief DLA Approved Optimizations for QML Products (Rev. C) PDF | HTML 2025年 6月 17日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. B) PDF | HTML 2025年 6月 10日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B) 2025年 2月 20日
Certificate TPS7H1121EVM-CVAL EU Declaration of Conformity (DoC) 2024年 4月 5日
Application note QML flow, its importance, and obtaining lot information (Rev. C) 2023年 8月 30日
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 2022年 10月 19日
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 2020年 8月 21日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日

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TPS7H1121EVM-CVAL — TPS7H1121-SP 評估模組

TPS7H1121EVM-CVAL 展示單一 TPS7H1121-SP LDO 穩壓器的運作。電路板提供可裝入其他元件的元件封裝，以便進行自訂配置測試，並提供測試點和 SMA 連接器，以簡化性能驗證。
使用指南: PDF | HTML
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TPS7H1121-SP PSpice Model

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