10 Revision History
Changes from Revision H (March 2025) to Revision I (July 2025)
- Fixed typo regarding the maximum operating current only in the "Description"
section.Go
- Made corrections on labeling errors for reverse breakdown change
with current with no specification changes. Go
Changes from Revision G (January 2016) to Revision H (March 2025)
- Updated the numbering format for tables, figures, and cross-references throughout
the documentGo
- Updated Applications linksGo
- Updated LP pin numberingGo
- Added electromagnetic interference note and updated LP pinout
numbering.Go
- Removed machine model (MM) ESD
specification, updated CDM ESD specification.Go
- Updated reverse current specification Go
- Changed minimum operating current test conditions from: LM4041EEM3,
LM4041QEEM3 to: TA = TJ = TMIN to
TMAX
Go
- Changed VR temperature coefficient test conditions from: LM4041EEM3, LM4041QEEM3 to:
IR = 10mAGo
- Changed VR temperature coefficient test conditions from: LM4041EEM3, LM4041QEEM3 to:
IR = 100µAGo
- Added ΔVREF/ΔVKA information for adjustable
versions.Go
- Added ordering information for part numbers which include
"X".Go
Changes from Revision F (July 2013) to Revision G (October 2015)
- Added ESD Ratings table, Feature Description section,
Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section,
Device and Documentation Support section, and Mechanical,
Packaging, and Orderable Information section Go
- Updated pinout diagrams Go
Changes from Revision D (April 2013) to Revision E (April 2013)
- Changed layout of National Data Sheet to TI formatGo