SBASAE4 December   2025 ADS125P08

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Switching Characteristics
    8. 5.8 Timing Diagrams
    9. 5.9 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1  Offset Error Measurement
    2. 6.2  Offset Drift Measurement
    3. 6.3  Gain Error Measurement
    4. 6.4  Gain Drift Measurement
    5. 6.5  NMRR Measurement
    6. 6.6  CMRR Measurement
    7. 6.7  PSRR Measurement
    8. 6.8  SNR Measurement
    9. 6.9  INL Error Measurement
    10. 6.10 THD Measurement
    11. 6.11 SFDR Measurement
    12. 6.12 Noise Performance
    13. 6.13 TUE (Total Unadjusted Error) Measurement
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Input Multiplexer
      2. 7.3.2  High-Impedance Input Buffers
      3. 7.3.3  Input Range
      4. 7.3.4  ADC Reference Voltage
      5. 7.3.5  Power Supplies
        1. 7.3.5.1 AVDD and AVSS
        2. 7.3.5.2 IOVDD
        3. 7.3.5.3 CAPA and CAPD
        4. 7.3.5.4 Power-On Reset (POR)
      6. 7.3.6  Clock Operation
        1. 7.3.6.1 Internal Oscillator
        2. 7.3.6.2 External Clock
      7. 7.3.7  Modulator
      8. 7.3.8  Digital Filter
        1. 7.3.8.1 Digital Filter Latency
        2. 7.3.8.2 Sinc3 and Sinc4 Filters
        3. 7.3.8.3 Sinc4 + Sinc1 Cascade Filter
        4. 7.3.8.4 50/60Hz Notch Filters
      9. 7.3.9  FIFO Buffer
        1. 7.3.9.1 FIFO Buffer Read and Write
        2. 7.3.9.2 FIFO Overflow and Underflow
        3. 7.3.9.3 FIFO Depth Indicator
        4. 7.3.9.4 FIFO Enable and Flush
        5. 7.3.9.5 FIFO Thresholds
      10. 7.3.10 Channel Auto-Sequencer
        1. 7.3.10.1 Auto-Sequencer: Basic Operation
        2. 7.3.10.2 Sequencer Modes
          1. 7.3.10.2.1 Single-Shot Mode
          2. 7.3.10.2.2 Single Step Continuous Conversion Mode
          3. 7.3.10.2.3 Single Sequence Mode
          4. 7.3.10.2.4 Continuous Sequence Mode
        3. 7.3.10.3 Configuring the Auto-Sequencer
        4. 7.3.10.4 Starting and Stopping the Sequencer
        5. 7.3.10.5 Auto-Sequencer and DRDY Behavior
      11. 7.3.11 Offset and Gain Calibration
      12. 7.3.12 General Purpose IOs (GPIOs)
        1. 7.3.12.1 DRDY Output
        2. 7.3.12.2 FAULT Output
      13. 7.3.13 Burn-Out Current Sources
      14. 7.3.14 Open Wire Detection with ADC 0-code output
      15. 7.3.15 System Monitors
        1. 7.3.15.1 Internal Short (Offset Calibration)
        2. 7.3.15.2 Internal Temperature Sensor
        3. 7.3.15.3 External Reference Voltage Readback
        4. 7.3.15.4 Power-Supply Readback
      16. 7.3.16 Monitor Flags, Indicators and Counters
        1. 7.3.16.1  Reset (RESETn flag)
        2. 7.3.16.2  AVDD Undervoltage Monitor (AVDD_UVn flag)
        3. 7.3.16.3  Reference Undervoltage Monitor (REV_UVn flag)
        4. 7.3.16.4  Modulator Overrange Monitor (MOD_OVR_FAULTn flag)
        5. 7.3.16.5  Register Map CRC (REG_MAP_CRC_FAULTn flag)
        6. 7.3.16.6  Memory Map CRC (MEM_INTERNAL_FAULTn flag)
        7. 7.3.16.7  FIFO Overflow (FIFO_OFn flag) and FIFO Underflow (FIFO_UFn flag)
        8. 7.3.16.8  FIFO CRC Fault (FIFO_CRC_FAULTn flag)
        9. 7.3.16.9  GPIO Readback
        10. 7.3.16.10 SPI CRC Fault (SPI_CRC_FAULTn flag)
        11. 7.3.16.11 Register Write Fault (REG_WRITE_FAULTn flag)
        12. 7.3.16.12 DRDY Indicator (DRDY bit)
        13. 7.3.16.13 Sequencer Active Indicator (SEQ_ACTIVE bit)
        14. 7.3.16.14 Sequence Step Indicator (STEP_INDICATOR[4:0])
        15. 7.3.16.15 ADC Conversion Counter (CONV_COUNT[3:0])
        16. 7.3.16.16 FIFO Depth Indicator (FIFO_DEPTH[8:0])
        17. 7.3.16.17 Completed Sequence Counter (SEQ_COUNT[3:0])
      17. 7.3.17 Test DAC (TDAC)
      18. 7.3.18 Parallel Post Filters
        1. 7.3.18.1 Configuring the Parallel Post Filters
        2. 7.3.18.2 Frequency Response of the Parallel Post Filters
        3. 7.3.18.3 Settling Times and DRDY Behavior When Using the Post Filters
        4. 7.3.18.4 Examples of Recommended Post Filter Settings
      19. 7.3.19 Chip Select Forwarding
        1. 7.3.19.1 Configuring the CS forward feature
        2. 7.3.19.2 CS Forward Timeout
        3. 7.3.19.3 CS Forward Header, Frame, and State Diagram
        4. 7.3.19.4 Disabling the CS-FWD mode
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-Scalable Speed Modes
      2. 7.4.2 Sequencer Functional Modes
      3. 7.4.3 Idle Mode and Standby Mode
      4. 7.4.4 Power-Down Mode
      5. 7.4.5 Reset
        1. 7.4.5.1 RESET Pin
        2. 7.4.5.2 Reset by SPI Register Write
        3. 7.4.5.3 Reset by SPI Input Pattern
      6. 7.4.6 Synchronization
      7. 7.4.7 Conversion-Start Delay Time
    5. 7.5 Programming
      1. 7.5.1  Serial Interface (SPI)
      2. 7.5.2  Serial Interface Signals
        1. 7.5.2.1 Chip Select (CS)
        2. 7.5.2.2 Serial Clock (SCLK)
        3. 7.5.2.3 Serial Data Input (SDI)
        4. 7.5.2.4 Serial Data Output/Data Ready (SDO/DRDY)
        5. 7.5.2.5 Data Ready (DRDY) Pin
      3. 7.5.3  Serial Interface Communication Structure
        1. 7.5.3.1 SPI Frame
        2. 7.5.3.2 STATUS Header
        3. 7.5.3.3 SPI CRC
      4. 7.5.4  Device Commands
        1. 7.5.4.1 No-Operation
        2. 7.5.4.2 Read Conversion Data
        3. 7.5.4.3 Read Register Command
        4. 7.5.4.4 Write Register Command
        5. 7.5.4.5 Read FIFO Buffer Command
      5. 7.5.5  Continuous Read Mode
        1. 7.5.5.1 Read Conversion Data in Continuous Read Mode
        2. 7.5.5.2 Read Registers in Continuous Read Mode
        3. 7.5.5.3 Read FIFO Buffer in Continuous Read Mode
      6. 7.5.6  SPI communication after POR or Reset
      7. 7.5.7  DRDY Pin Behavior
      8. 7.5.8  Daisy-Chain Operation
      9. 7.5.9  3-Wire SPI Mode
        1. 7.5.9.1 3-Wire SPI Mode Frame Re-Align
      10. 7.5.10 Conversion Data
      11. 7.5.11 Data Ready
        1. 7.5.11.1 DRDY Pin and SDO/DRDY Pin
        2. 7.5.11.2 DRDY Bit
        3. 7.5.11.3 Clock Counting
    6. 7.6 Register Map
      1. 7.6.1 ADS125P08 Status and General Configuration Page
      2. 7.6.2 ADS125P08 Step Configuration Page
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Serial Interface Connections
      2. 8.1.2 Interfacing with Multiple Devices
      3. 8.1.3 Unused Inputs and Outputs
      4. 8.1.4 Device Initialization
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plots - Crosstalk
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power Supplies
      2. 8.3.2 Power-Supply Sequencing
      3. 8.3.3 Power-Supply Decoupling
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

7.3.8.1 Digital Filter Latency

When starting or restarting conversions, the digital filter resets and requires a certain amount of time to provide settled output data. This time is called the latency time, tLATENCY. The ADS125P08 hide the unsettled data internally and only indicate when settled conversion data are available, by means of a falling DRDY edge or the DRDY bit. Table 7-15 and Table 7-12 summarize the latency times for the various speed modes and digital filter settings. The latency times are measured from the rising CS edge of the register write frame where the START bit is set to 1b in idle mode (or the assertion/rising edge of the START pin), to the first falling DRDY edge. Because the CS signal in the SPI clock domain is latched by the digital filter logic running on the modulator clock domain, the latency times provided have an uncertainty of ±1 tMOD. The conversion period for the second and all subsequent conversions equals tDATA = 1 / fDATA = OSR / fMOD as shown in Figure 7-11.

ADS125P08 Latency Time and Conversion Period Figure 7-11 Latency Time and Conversion Period

The latency time increases in certain situations:

  • when starting conversions from standby mode: adds 10 up to 33 tMOD (this can depend on the speed mode).
  • when restarting ongoing conversions by writing to a register which restarts conversions: the conversion is stopped, and the user needs to write the START bit (or assert the START pin) to start the conversion again.

In addition, a programmable delay time can be added to delay the start of the conversion cycle after the START bit is set (or after the START pin rising edge). This delay time allows for settling of external components, such as the voltage reference after exiting standby mode, or for additional settling time when switching the signal through the multiplexer. The delay time is only added to the first conversion after a conversion start as shown in Figure 7-11, or at the beginning of every new sequence step when the sequencer is active. In sequencer operation, the programmable delay time can be configured independently for each individual sequence step. See the Conversion-Start Delay Time section for details on the programmable delay time.

See also the Auto-Sequencer and DRDY Behavior section for more details on latency and settling when using the sequencer.