SLASFH8 March   2026 MSPM33C321A-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Functional Block Diagram
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
    1. 6.1 Pin Diagrams
    2. 6.2 Pin Attributes
      1.      10
    3. 6.3 Signal Descriptions
      1.      12
      2.      13
      3.      14
      4.      15
      5.      16
      6.      17
      7.      18
      8.      19
      9.      20
      10.      21
      11.      22
      12.      23
      13.      24
      14.      25
      15.      26
      16.      27
    4. 6.4 Connections for Unused Pins
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Supply Current Characteristics
      1. 7.5.1 RUN/SLEEP Modes
      2. 7.5.2 STOP/STANDBY Modes
      3. 7.5.3 SHUTDOWN Mode
      4. 7.5.4 VBAT current consumption
    6. 7.6  Flash Memory Characteristics
    7. 7.7  Power Supply Sequencing
      1. 7.7.1 Power Supply Ramp
      2. 7.7.2 POR and BOR
      3. 7.7.3 VBat Characteristics
      4. 7.7.4 Timing Characteristics
    8. 7.8  Clock Specifications
      1. 7.8.1 System Oscillator (SYSOSC)
      2. 7.8.2 High Frequency Crystal/Clock
      3. 7.8.3 System Phase Lock Loop (SYSPLL)
      4. 7.8.4 Low Frequency Oscillator (LFOSC)
      5. 7.8.5 Low Frequency Crystal/Clock
    9. 7.9  Analog Specifications
      1. 7.9.1 ADC Specifications
        1. 7.9.1.1 ADC Electrical Characteristics
        2. 7.9.1.2 ADC Switching Characteristics
        3. 7.9.1.3 ADC Linearity Parameters
        4. 7.9.1.4 Typical Connection Diagram
      2. 7.9.2 COMP Specifications
        1. 7.9.2.1 Comparator Electrical Characteristics
        2. 7.9.2.2 COMP DAC Electrical Characteristics
      3. 7.9.3 VREF Specifications
        1. 7.9.3.1 VREF Voltage Characteristics
        2. 7.9.3.2 VREF Electrical Characteristics
      4. 7.9.4 Analog VBOOST Specification
        1. 7.9.4.1 Analog Mux VBOOST
      5. 7.9.5 Temperature Sensor
    10. 7.10 Serial Interface Specifications
      1. 7.10.1 UART
        1. 7.10.1.1 UART
      2. 7.10.2 I2C
        1. 7.10.2.1 I2C Characteristics
        2. 7.10.2.2 I2C Filter
        3. 7.10.2.3 I2C Timing Diagram
      3. 7.10.3 SPI
        1. 7.10.3.1 SPI
        2. 7.10.3.2 SPI Timing Diagram
      4. 7.10.4 CAN
        1. 7.10.4.1 CAN
      5. 7.10.5 QSPI
        1. 7.10.5.1 QSPI
        2. 7.10.5.2 QSPI Timing Diagram
      6. 7.10.6 I2S/TDM
        1. 7.10.6.1 Serial Audio
        2. 7.10.6.2 I2S/TDM Timing Diagram
    11. 7.11 Digital IO
    12. 7.12 TRNG
      1. 7.12.1 TRNG Electrical Characteristics
      2. 7.12.2 TRNG Switching Characteristics
    13. 7.13 Emulation and Debug
      1. 7.13.1 SWD Timing
  9. 8 Detailed Description
    1. 8.1  Arm Cortex-M33 core with TrustZone and FPU
    2. 8.2  Power Management and Clock Unit (PMCU)
      1. 8.2.1 Power Management Unit (PMU)
      2. 8.2.2 Clock Module (CKM)
      3. 8.2.3 Operating Modes
        1. 8.2.3.1 Functionality by Operating Mode
    3. 8.3  Device Memory Map
      1. 8.3.1 Memory Organization
      2. 8.3.2 Peripheral Memory Map
    4. 8.4  NVIC Interrupt Map
    5. 8.5  Embedded Flash Memory
    6. 8.6  Embedded SRAM
    7. 8.7  DMA
    8. 8.8  Event Manager
    9. 8.9  Error Aggregator Module (EAM)
    10. 8.10 GPIO
    11. 8.11 IOMUX
      1. 8.11.1 Input/Output Diagrams
    12. 8.12 Analog Modules
      1. 8.12.1 HSADC
      2. 8.12.2 COMP
      3. 8.12.3 Temperature Sensor
      4. 8.12.4 VREF
      5. 8.12.5 Device Analog Connections
    13. 8.13 Security and Cryptography
      1. 8.13.1 Global Security Controller (GSC)
      2. 8.13.2 AESADV
      3. 8.13.3 SHA256
      4. 8.13.4 Public Key Algorithm (PKA)
      5. 8.13.5 TRNG
      6. 8.13.6 Keystore
      7. 8.13.7 CRC
    14. 8.14 Serial Communication Interfaces
      1. 8.14.1 UNICOMM (UART/I2C/SPI)
        1. 8.14.1.1 UART (UNICOMM)
        2. 8.14.1.2 I2C (UNICOMM)
        3. 8.14.1.3 SPI (UNICOMM)
      2. 8.14.2 CAN-FD
      3. 8.14.3 Quad SPI (QSPI)
      4. 8.14.4 Digital Audio Interface - I2S/TDM
    15. 8.15 LFSS
    16. 8.16 Timers, RTC and Watchdogs
      1. 8.16.1 Timers (TIMx)
      2. 8.16.2 RTC_A
      3. 8.16.3 IWDT
      4. 8.16.4 WWDT
    17. 8.17 Serial Wire Debug Interface
    18. 8.18 Bootstrap Loader (BSL)
    19. 8.19 Device Factory Constants
    20. 8.20 Identification
  10. 9 Applications, Implementation, and Layout
    1. 9.1 Typical Application
      1. 9.1.1 Schematic
  11. 10Device and Documentation Support
    1. 10.1 Getting Started and Next Steps
    2. 10.2 Device Nomenclature
    3. 10.3 Tools and Software
    4. 10.4 Documentation Support
    5. 10.5 Support Resources
    6. 10.6 Trademarks
    7. 10.7 Electrostatic Discharge Caution
    8. 10.8 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

7.7.4 Timing Characteristics

VDD=3.3V, Ta=25℃ (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Wakeup Timing
tWAKE:SLEEP Wakeup time from SLEEP to RUN (1) 1.6 µs
tWAKE:STOP Wakeup time from STOP to RUN (SYSOSC enabled) (1) 25.3 µs
tWAKE:STBY Wakeup time from STANDBY0 to RUN (1) 26.6 µs
Wakeup time from STANDBY1 to RUN (1) 26.8 µs
tWAKEUP:SHDN Wakeup time from SHUTDOWN to RUN (2) Fast boot enabled TBD µs
Fast boot disabled 702
Asynchronous Fast Clock Request Timing
tDELAY Delay time from edge of asynchronous request to first 32MHz MCLK edge Mode is STOP 6.3 µs
Delay time from edge of asynchronous request to first 32MHz MCLK edge Mode is STANDBY0 7.6
Delay time from edge of asynchronous request to first 32MHz MCLK edge Mode is STANDBY1 7.9
Startup Timing
tSTART:RESET Device cold startup time from reset/power-up (3) Fast boot enabled TBD µs
Fast boot disabled 746
NRST Timing
tRST:BOOTRST Pulse length on NRST pin to generate BOOTRST ULPCLK≥4MHz 1.5 µs
ULPCLK=32kHz 80
tRST:POR Pulse length on NRST pin to generate POR 1 s
(1) The wake-up time is measured from the edge of an external wake-up signal (GPIO wake-up event) to the time that the first instruction of the user program is executed, with glitch filter disabled (FILTEREN=0x0) and fast wake enabled (FASTWAKEONLY=1) .
(2) The wake-up time is measured from the edge of an external wake-up signal (IOMUX wake-up event) to the time that first instruction of the user program is executed.
(3) The start-up time is measured from the time that VDD crosses VBOR0- (cold start-up) to the time that the first instruction of the user program is executed.