SLLSFT1 October 2026 TIOM2212
ADVANCE INFORMATION
LP_CFG0 register settings can be used to configure the L+ supply current limits. LP_TSC and LP_TAR set the current fault blanking time and auto-recovery time, respectively. LP_AR_DIS controls the auto-recovery behavior. If current through the L+ path exceeds the ILIM set by LP_CLIM bits, then an overcurrent fault is generated. The controller periodically rechecks if the output is still in a current limited condition. In this condition, the device is switched on for LP_TSC and switched off for LP_TAR.
To further reduce the power dissipated in the NFET transistors during turn-on of loads that require large inrush currents (e.g., capacitive loads), the current limiter includes a dynamic blanking time mode that reduces the blanking time when the voltage across the NFET is high, limiting the pulse energy during the initial turn-on phase. Dynamic blanking time mode is operational when the L+ output voltage is below 7V and must be enabled by setting the LP_DYBL_EN bit in the LP_CFG1 register.