SPRT759B October   2023  – June 2026 F28377D-SEP , F29H850DM , F29H850TU , F29H859TU-Q1 , F29P329SM-Q1 , F29P589DM-Q1 , F29P589DU-Q1 , TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of IEC 60730 and UL 1998 Classifications
    1.     C2000 Capability by Device Family
  6. 3C2000 Safety Collateral
    1.     Getting Started
    2.     Functional Safety Manuals
    3.     Software Collateral
  7. 4Implementing Acceptable Measures on C2000 Real-Time MCUs
    1.     Implementation Steps
    2.     Example Mapping
    3.     Additional Best Practices
  8. 5Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1.     Unique Identifier Reference
    2. 5.1 F28002x, F280013x, F280015x, F28E12x Mapping
      1. 5.1.1 CPU Related Faults
      2. 5.1.2 Interrupt Related Faults
      3. 5.1.3 Clock Related Faults
      4. 5.1.4 Memory Related Faults
      5. 5.1.5 Internal Data Path Faults
      6. 5.1.6 Input/Output Related Faults
    3. 5.2 F28004x, F28003x, F28P55x Mapping
      1. 5.2.1 CPU Related Faults
      2. 5.2.2 Interrupt Related Faults
      3. 5.2.3 Clock Related Faults
      4. 5.2.4 Memory Related Faults
      5. 5.2.5 Internal Data Path Faults
      6. 5.2.6 Input/Output Related Faults
    4. 5.3 F2837x, F2838x, F28P65x Mapping
      1. 5.3.1 CPU Related Faults
      2. 5.3.2 Interrupt Related Faults
      3. 5.3.3 Clock Related Faults
      4. 5.3.4 Memory Related Faults
      5. 5.3.5 Internal Data Path Faults
      6. 5.3.6 Input/Output Related Faults
    5. 5.4 F29H85x, F29P85x, F29P32x Mapping
      1. 5.4.1 CPU Related Faults
      2. 5.4.2 Interrupt Related Faults
      3. 5.4.3 Clock Related Faults
      4. 5.4.4 Memory Related Faults
      5. 5.4.5 Internal Data Path Faults
      6. 5.4.6 Input/Output Related Faults
    6.     Communication, Monitoring Devices, and Custom Chip Faults
  9. 6Glossary
  10. 7References
  11. 8Revision History

5.4.6 Input/Output Related Faults

Table 5-25 Input/Output Periphery Faults to Unique ID Mapping
Component Class B/1 (1) Class C/2 Acceptable Measure (2) C2000 Unique IDs (3)
Definition Description F29H85x
F29P58x
F29P32x
7.1 Digital I/O rq H.2.18.13
A7.1.17		 Plausibility check GPIO4
rq H.2.18.8
A7.1.9		 Input comparison GPIO5
H.2.18.11
A7.1.15		 Multiple parallel outputs GPIO5
H.2.18.12
A7.1.16		 Output verification GPIO4
7.2 Analog I/O
7.2.1 A/D and D/A converter		 rq H.2.18.13
A7.1.17 		Plausibility check ADC2
ADC8
rq H.2.18.8
A7.1.9		 Input comparison ADC10
7.2 Analog I/O
7.2.2 Analog multiplexer		 rq H.2.18.13
A7.1.17		 Plausibility check ADC2
ADC8
rq H.2.18.15
A7.1.19		 Input comparison ADC10
(1) rq: coverage of the failure mode (see Table 2-2) is required by the standards for the indicated class. More than one acceptable measure may be available to choose from.
(2) For a complete list of acceptable measures and their definitions, see the IEC / UL specifications.
(3) For a description and implementation suggestions for each ID, see the Functional Safety Manual.